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C7942CA LT1254CS SE051 C3467 2N2576 UN5212 HY57V 2SC3341
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    N74F827D N74F827DB N74F827N N74F828D N74F828N 74F827 74F828 74F827_74F828_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. N74F827D N74F827DB N74F827N N74F828D N74F828N 74F827 74F828 74F827_74F828_2
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1994 Dec 05 5 Philips...
Description 10-bit buffer/line driver / non-inverting 3-State
From old datasheet system
10-bit buffer/line driver, non-inverting 3-State

File Size 97.77K  /  12 Page

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    CXD1250M CXD1250N

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SONY[Sony Corporation]
Part No. CXD1250M CXD1250N
OCR Text ... negative voltage. To this end, raise VL and VHH at the application circuit under the following conditions. VHH (20V) t1 20% 0V 20% VL (-10V) t2 t2 t1 10msec -6- CXD1250M/N Package Outline CXD1250M Unit: mm 20PIN SOP (P...
Description Vertical Clock Driver for CCD Image sensor
From old datasheet system

File Size 153.56K  /  7 Page

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    LTC1262 LTC1262C LTC1262CN8 LTC1262CS8 LTC1262I LTC1262IS8 1262FA

Linear Technology, Corp.
LINER[Linear Technology]
Part No. LTC1262 LTC1262C LTC1262CN8 LTC1262CS8 LTC1262I LTC1262IS8 1262FA
OCR Text ...e applied to the charge pump to raise VOUT. When VDIV is above VBGAP by VHYST, the oscillator pulses are prevented from clocking the charge pump. VOUT drops until VDIV is below VBGAP by VHYST again. The gates of all internal switches are dr...
Description 12V, 30mA Flash Memory Programming Supply 12V的,30mA的闪存编程电
12V/ 30mA Flash Memory Programming Supply
From old datasheet system

File Size 219.37K  /  8 Page

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    LTC1263 LTC1263CS8 1263F

Linear Technology
Part No. LTC1263 LTC1263CS8 1263F
OCR Text ...e applied to the charge pump to raise VOUT. When VDIV is above VBGAP by VHYST, the VCC VOUT COUT Figure 3. C1 and C2 Charge to VCC APPLICATIONS INFORMATION Choice of Capacitors The LTC1263 is tested with the capacitors shown in Fig...
Description 12V/ 60mA Flash Memory Programming Supply
12V, 60mA Flash Memory Programming Supply
From old datasheet system

File Size 220.93K  /  8 Page

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    M52693 M52693SP

MITSUBISHI[Mitsubishi Electric Semiconductor]
Part No. M52693 M52693SP
OCR Text ... VfSCL GND VfSCH fcp (+) 1) raise the frequency of SG8 input signal so that the signal is synchronous with pin 19 output signal. 2) Lower the SG8 frequency. 3) Measure the SG8 frequency (f1) when the SG8 input signal is synchronous with...
Description From old datasheet system
BURST LOCK CLOCK GENERATOR

File Size 165.66K  /  9 Page

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    N74F2240D N74F2240N N74F2241D N74F2241N 74F2241 74F2240

NXP Semiconductors N.V.
PHILIPS[Philips Semiconductors]
Part No. N74F2240D N74F2240N N74F2241D N74F2241N 74F2241 74F2240
OCR Text ...d shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTI...
Description Octal inverter buffer with 30ohm equivalent output termination 3-State F/FAST SERIES, DUAL 4-BIT DRIVER, INVERTED OUTPUT, PDIP20

File Size 88.93K  /  10 Page

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    N74F2244D N74F2244DB N74F2244N 74F2244

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F2244D N74F2244DB N74F2244N 74F2244
OCR Text ...d shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTI...
Description Octal buffer with 30ohm equivalent output termination 3-State

File Size 89.96K  /  10 Page

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    N74F2245D N74F2245DB N74F2245N 74F2245

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F2245D N74F2245DB N74F2245N 74F2245
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTI...
Description Octal transceiver with 30ohm equivalent output termination 3-State

File Size 97.65K  /  10 Page

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    N74F225D N74F225N 74F225

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F225D N74F225N 74F225
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. June 15, 1992 6 Phili...
Description 16X5 asynchronous FIFO 3-State

File Size 114.75K  /  14 Page

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    N74F260 N74F260D N74F260N 74F260 74F260_2

PHILIPS[Philips Semiconductors]
Part No. N74F260 N74F260D N74F260N 74F260 74F260_2
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1988 Nov 29 3 Philips...
Description From old datasheet system
Dual 5-input NOR gate

File Size 68.85K  /  8 Page

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