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For readings Found Datasheets File :: 1751 Search Time::0.969ms
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				PHILIPS[Philips Semiconductors]
Part No.	N74F260 N74F260D N74F260N 74F260 74F260_2
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1988 Nov 29 3 Philips Semiconductors Product specification Dual 5-input NOR gate 74...
Description	From old datasheet system Dual 5-input NOR gate
File Size	68.85K / 8 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	N74F269 N74F269D N74F269DB N74F269N 74F269 74F269_2
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1996 Jan 05 5 Philips Semiconductors Product specification 8-bit bidirectional binary counte...
Description	From old datasheet system 8-bit bidirectional binary counter
File Size	118.22K / 14 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F534D N74F534N 74F533 74F534
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTICS LIMITS SYMBOL PARAMETER TEST CONDITIONS Tamb= +25C VCC = +5V CL = 5...
Description	Latch/flip-flop
File Size	97.37K / 12 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F537D N74F537N 74F537
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last. 1989 Jan 20 3 Philips Semiconductors Product specification 1-of-10 decoder (3-State) 74F5...
Description	1-of-10 decoder 3-State
File Size	47.75K / 5 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors N.V.
Part No.	N74F538D N74F538N 74F538
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last. 1989 Apr 06 4 Philips Semiconductors Product specification 1-of-8 decoder (3-State) 74F538 A...
Description	1-of-8 decoder (3-State) 1-of -8 decoder (3?state) 1-of -8 decoder 3-state F/FAST SERIES, OTHER DECODER/DRIVER, CONFIGURABLE OUTPUT, PDIP20
File Size	85.81K / 10 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F539D N74F539N 74F539
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS should be performed last. 1990 Feb 23 3 Philips Semiconductors Product specification Dual 1-of-4 decoder (3-State) ...
Description	Dual 1-of-4 decoder 3-State
File Size	40.54K / 5 Page	View it Online	Download Datasheet

				NXP Semiconductors N.V. PHILIPS[Philips Semiconductors]
Part No.	N74F620D N74F620N N74F623N 74F620 74F623 N74620D N74620N N74623D N74623N N74F623D 74F620_623_1
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1990 Apr 6 6 Philips Semiconductors Product specification Transceivers 74F620/74F62...
Description	Octal bus transceiver, inverting 3tate 八路总线收发器，反相3tate Octal bus transceiver, non-inverting (3-State)(八通道总线收发器，同向（三态）) Octal bus transceiver / inverting 3tate From old datasheet system
File Size	96.71K / 12 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	N74F640 N74F640D N74F640N 74F640 74F640_2
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1989 Nov 27 5 Philips Semiconductors Product specification Octal bus transceiver, inve...
Description	Octal bus transceiver / inverting 3-State From old datasheet system Octal bus transceiver, inverting (3-State) Octal bus transceiver, inverting 3-State Octal bus transceiver inverting 3-State
File Size	85.22K / 11 Page	View it Online	Download Datasheet

				PHILIPS[Philips Semiconductors] NXP Semiconductors
Part No.	N74F646AD N74F646AN N74F646D N74F646N N74F648AD N74F648AN N74F648D N74F648N 74F648A 74F646 74F646A 74F648
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. IO is tested under conditions that produce current approximately one half of the true short-circui...
Description	16-Bit Ultra-Low-Power Microcontroller, 24kB Flash, 1024B RAM, 12-Bit ADC, USART, 160 Segment LCD 80-LQFP -40 to 85 16-Bit Ultra-Low-Power Microcontroller, 24kB Flash, 1024B RAM, 12-Bit ADC, USART, 160 Segment LCD 100-LQFP -40 to 85 Octal transceiver/register, non-inverting(3-State)(八收发器/寄存器，（同相，三态）) Octal transceiver/register / non-inverting 3-State Octal transceiver/register non-inverting 3-State Octal transceiver/register, non-inverting 3-State
File Size	121.16K / 16 Page	View it Online	Download Datasheet

				NXP Semiconductors PHILIPS[Philips Semiconductors]
Part No.	N74F64D N74F64N 74F64
OCR Text	...ormal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1996 Mar 14 4 Philips Semiconductors Product specification 4-2-3-2-input AND-OR-invert...
Description	4-2-3-2-input AND-OR-invert gate 16-Bit Ultra-Low-Power Microcontroller, 24kB Flash, 1024B RAM, USART, 160 Segment LCD 100-LQFP -40 to 85
File Size	67.45K / 8 Page	View it Online	Download Datasheet

For readings Found Datasheets File :: 1751 Search Time::0.969ms
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