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TPL12100 SH8G41 NSC05556 RU5024 1ATETR ESD05000 K4S51 STU404D
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    TK11900 TK11900M TK11900MTL TK11900MTL_GO TK11900MTL/GO

TOKO Inc.
TOKO[TOKO, Inc]
Part No. TK11900 TK11900M TK11900MTL TK11900MTL_GO TK11900MTL/GO
OCR Text ...increase the output current (or raise the input voltage) until the thermal protection circuit is activated. Calculate the power dissipation of the device by subtracting the output power from the input power. These measurements should allow ...
Description Cap-Free, NMOS, 150mA Low Dropout Regulator with Reverse Current Protection
ADJUSTABLE LOW DROPOUT REGULATOR

File Size 72.47K  /  10 Page

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    N74F280BD N74F280BN 74F280B I74F280BN 74F280 I74F280BD

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. N74F280BD N74F280BN 74F280B I74F280BN 74F280 I74F280BD
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1996 Mar 12 4 Philips...
Description 9-bit odd/even parity generator/checker(9位奇偶发生器/校验

File Size 106.32K  /  8 Page

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    N74F283D N74F283N 74F283

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F283D N74F283N 74F283
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. ICC should be measured with...
Description 4-bit binary full adder with fast carry

File Size 114.07K  /  10 Page

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    HCF4527B HCC4527B HCC4076BF HCF4076BC1 HCF4076BEY

STMICROELECTRONICS[STMicroelectronics]
Part No. HCF4527B HCC4527B HCC4076BF HCF4076BC1 HCF4076BEY
OCR Text ...rations (add, subtract, divide, raise to a power), solve algebraic and differential equations, generate naturel logarithms and trigonometric func- September 1990 1/13 HCC/HCF4527B FUNCTIONAL DIAGRAM ABSOLUTE MAXIMUM RATING Sym...
Description BCD RATE MULTIPLEXER

File Size 231.07K  /  13 Page

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    SY10E446 SY10E446JC SY10E446JCTR SY100E446 SY100E446JCTR

Micrel Semiconductor, Inc.
Part No. SY10E446 SY10E446JC SY10E446JCTR SY100E446 SY100E446JCTR
OCR Text ...zing this simple technique will raise the potential conversion frequency up to the maximum 1.3GHz of a stand-alone E446. CLK CLK E446B SOUT SOUT SIN SIN E446A SOUT SOUT SERIAL DATA D3 D2 D1 D0 D3 D2 D1 D0 D7 D6 D5 D4 D3 D2 D1...
Description 4-BIT PARALLEL-TO-SERIAL CONVERTER 100E SERIES, 4-BIT RIGHT PARALLEL IN SERIAL OUT SHIFT REGISTER, COMPLEMENTARY OUTPUT, PQCC28

File Size 81.13K  /  8 Page

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    AIC1660 AIC1660CN AIC1660CS

AIC[Analog Intergrations Corporation]
Analog Integrations Corporation
Part No. AIC1660 AIC1660CN AIC1660CS
OCR Text ... boost function is available to raise the oscillator frequency to optimize performance in specific applications. The "LV" terminal may be tied to GND to improve low input voltage (V IN 3V) operation, or be left floating for input voltage la...
Description Switched-Capacitor Voltage Converter

File Size 102.35K  /  8 Page

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    M66011FP

MITSUBISHI[Mitsubishi Electric Semiconductor]
Part No. M66011FP
OCR Text ...s case, rewrite data on SRL and raise CS. SRL write operation CS Busy flag (in M66011) OE INT Serial communication period SCLK 1T SOUT 2T 8T D08 9T D07 D06 D05 D04 D03 D02 D01 16T D00 (D0L) DI6 DI5 DI4 DI3 DI2 DI1 DI0 D015 D014 ...
Description SERIAL BUS CONTROLLER

File Size 95.24K  /  12 Page

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    N74F07N 74F07 N74F07D N74F07D-T

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F07N 74F07 N74F07D N74F07D-T
OCR Text ...d shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTI...
Description    Inverter/buffer drivers

File Size 72.14K  /  11 Page

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    N74F670D N74F670N 74F670 74F670_2

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. N74F670D N74F670N 74F670 74F670_2
OCR Text ... 74F670 of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. AC ELECTRICAL CHARACTERISTI...
Description 4 x 4 register file 3-State
From old datasheet system

File Size 98.00K  /  12 Page

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