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Samsung Semiconductor Co., Ltd.
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| Part No. |
2SK3600-01SJ 2SK3600-01L
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| OCR Text |
...tent ta=25 5 c operating ? tc=90degree d-322 22 life tch tch(max.) test duration : 3000 cycle 2 htrb temperature : 150+0/-5c (gate-source) bias voltage : v gs (max) d-323 22 (0:1) test duration : 1000hr 3 htrb temperature : 150+0/-5c (... |
| Description |
Low-Power, Single-/Dual-Level Battery Monitors with Hysteresis and Integrated µP Reset
STD MOSFET 性病MOSFET
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| File Size |
313.08K /
22 Page |
 View
it Online |
Download Datasheet
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Fuji Electric Holdings Co., Ltd.
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| Part No. |
2SK3513-01S
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| OCR Text |
...tent ta=25 5 c operating ? tc=90degree d-322 22 life tch tch(max.) test duration : 3000 cycle 2 htrb temperature : 150+0/-5c (gate-source) bias voltage : v gs (max) d-323 22 (0:1) test duration : 1000hr 3 htrb temperature : 150+0/-5c (... |
| Description |
STD LQg MOSFET MOSFET的性病的LQG
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| File Size |
206.57K /
21 Page |
View
it Online |
Download Datasheet |
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