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TF3055 0805K CFB949P 1N754 ISD2012 5KE130 OZ6833T P120PK
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  degradation. Datasheet PDF File

For degradation. Found Datasheets File :: 18907    Search Time::1.156ms    
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    AFT05MS003N

NXP Semiconductors
Part No. AFT05MS003N
OCR Text ...phase angles 21.1 9.0 no device degradation 1. measured in 136?174 mhz vhf broadband reference circuit. 2. measured in 350?520 mhz uhf broadband reference circuit. 3. measured in 520 mhz narrowband production test circuit. 4. the values sho...
Description High Ruggedness N-Channel Enhancement-Mode Lateral MOSFET

File Size 1,220.52K  /  20 Page

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    AFT05MP075GNR1 AFT05MP075NR1

NXP Semiconductors
Part No. AFT05MP075GNR1 AFT05MP075NR1
OCR Text ...2 (3 db overdrive) 17 no device degradation 1. measured in 450--520 mhz uhf broadband reference circuit. 2. measured in 520 mhz narrowband test circuit. features ? characterized for operation from 136 to 520 mhz ? unmatched input and output...
Description High Ruggedness N-Channel Enhancement-Mode Lateral MOSFETs

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    CBSL30 CBSL3007

http://
Advanced Semiconductor
Part No. CBSL30 CBSL3007
OCR Text ... VSWR = 20:1 VSWR = 10:1 No Degradation in Output Device No Degradation in Output Device No Degradation in Output Device Typ. Typ. Typ. VCE = 25 V 20% VSWR = 5:1 PIN = PIN (norm) +3 dB VCE = 25 V VCE = 25 V 20% PIN (norm) = +5 d...
Description NPN SILICON RF POWER TRANSISTOR
From old datasheet system

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    NJRC[New Japan Radio]
Part No. NSVA301
OCR Text ...an +60C, it might be a cause of degradation or destruction of the component. Even if it endures during a short time, it causes degradation of qualification. 2. When soldering iron is used, solder with the temperature at the tip of soldering...
Description From old datasheet system
JRC SAW FILTER

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    New Japan Radio Co., Ltd.
NJRC[New Japan Radio]
Part No. NSVS682
OCR Text ...an +70C, it might be a cause of degradation or destruction of the component. Even if it endures during a short time, it causes degradation of qualification. 2. When soldering iron is used, solder with the temperature at the tip of soldering...
Description 320.65MHz KEYLESS
From old datasheet system

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    NJRC[New Japan Radio]
Part No. NSVS792
OCR Text ...an +85C, it might be a cause of degradation or destruction of the component. Even if it endures during a short time, it causes degradation of qualification. 2. When soldering iron is used, solder with the temperature at the tip of soldering...
Description From old datasheet system
JRC SAW FILTER

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    TQM6M4001

TriQuint Semiconductor
Part No. TQM6M4001
OCR Text ...edness No permanent performance degradation, all angles Harmonics H2, H3 All other harmonics up to 13 GHz Power Control Slope VSWR VSWR Pout_min Iso_Ant Iso_Rx Nominal conditions Vbatt = 3.5V, VTX = High, Vramp = 0.2V, Pin = Pinmax VTX =...
Description 3V Quad-Band Transmit Module
3V Quad-Band GSM850/900 DCS/PCS Transmit Module

File Size 211.85K  /  17 Page

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    SI4300T

Silicon Laboratories
Part No. SI4300T
OCR Text ...84 1.8:1 no damage or permanent degradation Unit dBm dBm dBm Input VSWR Ruggedness Input Power Output Noise Power PIN PNOISE 3.5 -- -- -- -- -- -- -- 1.6:1 -- 9 -77 -77 1.8:1 no damage or permanent degradation dBm d...
Description Tri-Band Monolithic Power Amplifier System

File Size 114.46K  /  2 Page

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    NSVS806

New Japan Radio
Part No. NSVS806
OCR Text ... +70oc, it might be a cause of degradation or destruction of the component. even if it endures during a short time, it causes degradation of qualification. 2. when soldering iron is used, solder with the temperature at the tip of sold...
Description NewJRC SAW FILTER

File Size 218.71K  /  4 Page

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    GP2S27T2J00F GP2S27T3J00F GP2S27T5J00F GP2S27T6J00F GP2S27TJ000F GP2S27ABJ00F GP2S27BCJ00F GP2S27BJ000F GP2S27CJ000F GP2

Sharp Electrionic Components
Part No. GP2S27T2J00F GP2S27T3J00F GP2S27T5J00F GP2S27T6J00F GP2S27TJ000F GP2S27ABJ00F GP2S27BCJ00F GP2S27BJ000F GP2S27CJ000F GP2S27J0000F
OCR Text ...rporates non-coherent IRED. Degradation In general, the emission of the IRED used in photointerrupter will degrade over time. In the case of long term operation, please take the general IRED degradation (50% degradation over 5 years) i...
Description SMT, Detecting Distance : 0.7mm Phototransistor Output, Compact Refl ective Photointerrupter

File Size 169.71K  /  14 Page

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