| PART |
Description |
Maker |
| SGA-9189 |
Reliability Qualification Report
|
Stanford Microdevices
|
| SGA-8343X |
Reliability Qualification Report 可靠性鉴定报
|
STANFORD[Stanford Microdevices]
|
| SRF-1016Z SRF-2016Z SRQ-2116Z |
Reliability Qualification Report 可靠性鉴定报
|
Electronic Theatre Controls, Inc.
Stanford Microdevices
|
| BR1458S/D |
Reliability Report for the LCX Product Family 可靠性报告的回旋支产品系
|
Laird Technologies, Inc.
|
| EP11 |
Engineering Prototype Report - 70 W (19 V 3.66A) Universal Input Adapter (EP11)
|
Power Integrations, Inc.
|
| AN144 |
Audio Xcellence: XDCP Signal Integrity Report (AudioCharacterization Report)
|
Xicor
|
| XQV1000 XQC100-4CG560M XQC1000-4CG560M XQC300-4CG5 |
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NNA.
QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 1536 CLBS, 322970 GATES, PBGA352
QPro Virtex 2.5V QML High-Reliability FPGAs FPGA, 661111 GATES, PBGA432
QPro Virtex 2.5V QML High-Reliability FPGAs QPro的Virtex 2.5V的QML第高可靠性的FPGA
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957301NUA
QPro Virtex 2.5V QML high-reliability FPGA. SMD number 5962-9957201NUA.
|
Xilinx, Inc.
|
| GSELDIRUH33PA13B20K |
ELDRS Test Report
|
International Rectifier
|
| MBM29PL3200BE70PFV MBM29PL3200BE70PBT MBM29PL3200B |
32 M (2 M X 16/1 M X 32) BIT 1M X 32 FLASH 3V PROM, 90 ns, PBGA84
Replaced by TPS2046B : 0.345A, 2.7-5.5V Dual (1In/2Out) Hi-Side MOSFET, Fault Report, Act-Low Enable 8-PDIP -40 to 85 32米（2的MX 16 / 1的MX 32）位
Replaced by TPS2046B : 0.345A, 2.7-5.5V Dual (1In/2Out) Hi-Side MOSFET, Fault Report, Act-Low Enable 8-SOIC 0 to 85
|
Fujitsu, Ltd.
Fujitsu Limited
Fujitsu Component Limited.
FUJITSU LTD
Fujitsu Component Limit...
|
| TR636E-10164 |
QUALITY EVALUATION TEST REPORT IT3-25H
|
Hirose Electric
|
| TR636E-10163 |
QUALITY EVALUATION TEST REPORT IT3-15H
|
Hirose Electric
|
| EPR-16 |
Engineering Prototype Report for EP-16 2.75 W Charger/Adapter Using LNK501
|
POWERINT[Power Integrations, Inc.]
|
