PART |
Description |
Maker |
TLP3131 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation Toshiba Semiconductor
|
TLP209D-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
TLP3115 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
|
Toshiba Corporation Toshiba Semiconductor
|
TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation Toshiba Semiconductor
|
TLP3215 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
TLP3250 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
AT17LV256A-10JC AT17LV040A-10BJC AT17LV010A-10BJC |
FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQCC44 5015 RR 19#16 PIN PLUG FPGA配置EEPROM存储 FPGA Configuration EEPROM Memory 4M X 1 CONFIGURATION MEMORY, PQCC44 FPGA Configuration EEPROM Memory 1M X 1 CONFIGURATION MEMORY, DSO8 FPGA Configuration EEPROM Memory 2M X 1 CONFIGURATION MEMORY, PQFP44 High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-TSSOP -55 to 125 FPGA配置EEPROM存储 High Speed CMOS Logic Dual Monostable Multivibrators with Reset 16-SOIC -55 to 125 高速CMOS逻辑可复位双重单稳态多谐振荡器 SOIC-16封装 工作温度55℃_125 FPGA Configuration EEPROM Memory FPGA配置EEPROM存储 高速CMOS逻辑可复位双重单稳态多谐振荡器 PDIP-16封装 工作温度55℃_125 5015 RR 19#16 SKT PLUG High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-PDIP -55 to 125 5015 RR 8#16 PIN PLUG L/C High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SO -55 to 125 PhotoMOS Relay; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No; Supply Voltage:5V RoHS Compliant: No Connector assemblies, Ribbon (Flat); Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No RoHS Compliant: No High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-SOIC -55 to 125 High Speed CMOS Logic 3-to-8 Line Decoder Demutiplexer with Address Latches 16-TSSOP -55 to 125 5015 RR 4#12 SKT PLUG High Speed CMOS Logic 4-Bit Parallel Access Register 16-TSSOP -55 to 125 High Speed CMOS Logic Dual 4-Input AND Gates 14-SOIC -55 to 125 High Speed CMOS Logic Dual 4-Input AND Gates 14-PDIP -55 to 125 HV7 33W WCDMA NH780HS
|
Atmel, Corp. Atmel Corp. ATMEL Corporation
|
TLP354207 |
TESTERS DATA RECORDING EQUIPMENTS
|
Toshiba Corporation Toshiba Semiconductor
|
1N974B 1N963B 1N965B 1N962B 1N970B 1N960B 1N968D 1 |
0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 30V. Test current 4.2mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 120V. Test current 1.0mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 75V. Test current 1.7mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 39V. Test current 3.2mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 160V. Test current 0.80mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -20% tolerance. 0.5W SILICON ZENER DIODES Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・¥?????μ?μ?????°????????????μ?μ?????????a?£°???é???o3?o???????) 50μA低电流操作,低反向漏,低噪声稳压二极管(250μA工作电流,小反向漏电流,低噪声,齐纳二极管) PC 4/ 5-ST-7,62 .5W硅稳压二极管 Low Current Operation at 250?录A茂录?Low Reverse Leakage,Low Noise Zener Diode(250?录A氓路楼盲陆?莽?碌忙碌?茫??氓掳?氓??氓??忙录?莽?碌忙碌?茫??盲陆?氓?陋氓拢掳茫??茅陆?莽潞鲁盲潞?忙??莽庐隆) 0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 180V. Test current 0.68mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 200V. Test current 0.65mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 150V. Test current 0.85mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 68V. Test current 1.8mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 22V. Test current 5.6mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 7.5V. Test current 16.5mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 130V. Test current 0.95mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 51V. Test current 2.5mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 62V. Test current 2.0mA. -10% tolerance. 0.5W, silicon zener diode. Zener voltage 56V. Test current 2.2mA. -20% tolerance. 0.5W, silicon zener diode. Zener voltage 47V. Test current 2.7mA. -10% tolerance.
|
JGD[Jinan Gude Electronic Device] 济南固锝电子器件有限公司 Jinan Gude Electronic Device Co., Ltd. Semtech, Corp. 娴???洪??靛??ㄤ欢?????? Jinan Gude Electronic D...
|
0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|