| PART |
Description |
Maker |
| 5280 5733 5281 5515A 5279 |
PLCC Test Adapters Kit
|
Pomona Electronics
|
| 5901B |
Electronic Bench DMM Test Lead Kit
|
Pomona Electronics
|
| 6340 |
Deluxe DMM Maxi Test Lead Kit
|
Pomona Electronics
|
| 5674C |
Deluxe Electronic DMM Test Lead kit
|
Pomona Electronics
|
| 5677B |
Deluxe Multi-Use DMM Maxi-Test Lead Kit
|
Pomona Electronics
|
| 72902-0 72902-2 72903 |
Micro SMD Grabber Test Clips, Holding Rod and Kit
|
Pomona Electronics
|
| 44-547-11 44-547-11E |
Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
|
Aries Electronics, Inc.
|
| SN54LVTH182512HKC SN54LVTH18512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
http://
|
| 40-3554-18 40-3553-18 44-6553-18 44-6554-18 48-355 |
High-Temp Universal ZIF DIP Burn-in & Test Socket
High-Temp Universal ZIF DIP Burn-in & Test Socket
|
Aries Electronics, Inc.
|
| MAX5932 MAX5932ESA |
Replaced by SN54LS299 : 8-Bit Universal Shift/Storage Registers 20-CDIP -55 to 125
MAX5932 Evaluation Kit
|
MAXIM INTEGRATED PRODUCTS INC
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
