| PART |
Description |
Maker |
| DP104 |
DP104 Test Circuit
|
ETC
|
| NCS37012MNTWG |
Self Test Ground Fault Circuit Interrupter (GFCI)
|
ON Semiconductor
|
| 2420-31-G-S 2420-39-G 2420-31-N 2420-36-G 2420-310 |
PROTECTOR MODULE, SEALED W/O TEST POINTS TELECOM, SURGE PROTECTION CIRCUIT, XSS5
PROTECTOR MODULE, W/ O TEST POINTS TELECOM, SURGE PROTECTION CIRCUIT, XSS5
|
Bourns, Inc.
BOURNS INC
|
| NCS37010 |
Self Test With Lockout Ground Fault Circuit Interrupter (GFCI)
|
ON Semiconductor
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| LUCL9310GP-DT L9310 LUCL9310AP-D LUCL9310AP-DT LUC |
Line Interface and Line Access Circuit Full-Feature SLIC,Ringing Relay,and Test Access Device
|
AGERE[Agere Systems]
|
| NTE5296A NTE5240A NTE5241A NTE5242A NTE5243A NTE52 |
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 52.0V. Zener test current Izt = 240mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 33.0V. Zener test current Izt = 380mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 180.0V. Zener test current Izt = 68mA.
50 Watt Zener Diodes ±5% Tolerance
50 Watt Zener Diodes 5% Tolerance
50 WATT ZENER DIODES 【5% TOLERANCE
Low Current Operation at 250??A???Low Reverse Leakage,Low Noise Zener Diode(250??A?・￥?????μ?μ?????°????????????μ?μ?????????a?￡°???é???o3?o???????) 50μA低电流操作，低反向漏，低噪声稳压二极管（250μA工作电流，小反向漏电流，低噪声，齐纳二极管）
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 13.0V. Zener test current Izt = 960mA.
50 watt zener diode, -5% tolerance. Nominal zener voltage Vz = 43.0V. Zener test current Izt = 290mA.
|
NTE[NTE Electronics]
Fujitsu, Ltd.
NTE Electronics, Inc.
|
| RN2001 RN2002 RN2003 RN2005 RN2006 RN2004 |
Transistor Silicon PNP Epitaxial Type (PCT Process) Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications
Switching/ Inverter Circuit/ Interface Circuit And Driver Circuit Applications
Switching Inverter Circuit Interface Circuit And Driver Circuit Applications
|
TOSHIBA[Toshiba Semiconductor]
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| RN1707JE |
Transistor Silicon NPN Epitaxial Type (PCT process) (Bias Resistor built-in Transistor) Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications.
Switching/ Inverter Circuit/ Interface Circuit and Driver Circuit Applications.
|
Toshiba Semiconductor
|
| FJV4103R FJV4103RMTF |
Switching circuit, Inverter, Interface circuit, Driver Circuit
PNP Epitaxial Silicon Transistor
|
FAIRCHILD[Fairchild Semiconductor]
|
| BCR116W |
From old datasheet system
NPN Silicon Digital Transistor (Switching circuit, inverter, interface circuit, driver circuit)
|
SIEMENS[Siemens Semiconductor Group]
|
