| PART |
Description |
Maker |
| IDT5991A-7JI IDT5991A IDT5991A-2JI IDT5991A-5JI ID |
Scan Test Devices With 18-Bit Universal Bus Transceiver 64-LQFP -40 to 85
PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| LTC1382 LTC1382CN LTC1382CS LT1382 |
5V Low Power RS232 Transceiver with Shutdown DUAL LINE TRANSCEIVER, PDIP18
From old datasheet system
|
Linear Technology, Corp.
LINER[Linear Technology]
|
| BA7024 A5800785 |
Video signal switcher with test pattern generator
From old datasheet system
|
ROHM
|
| 74LVC646A_3 74LVC646A 74LVC646APWDH |
LVC/LCX/Z SERIES, 8-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO24
From old datasheet system
Octal bus transceiver/register (3-State)
|
NXP SEMICONDUCTORS
Philips
|
| DK-21192 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| DK-17600-A1 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| DK-14753 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
