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DATA SHEET MOS INTEGRATED CIRCUIT PD3719 10600 PIXELS x 3 COLOR CCD LINEAR IMAGE SENSOR The PD3719 is a color CCD (Charge Coupled Device) linear image sensor which changes optical images to electrical signal and has the function of color separation. The PD3719 has 3 rows of 10600 pixels, and each row has a single-sided readout type of charge transfer register. It has reset feed-through level clamp circuits and voltage amplifiers. Moreover, a large dynamic range is realized by using a large saturation voltage and a low-noise amplifier. Therefore, it is suitable for 1200 dpi/A4 professional color image scanners and so on. FEATURES * Valid photocell * Line spacing * Color filter * Resolution : 10600 pixels x 3 : 70 m (10 lines) Red line-Green line, Green line-Blue line : Primary colors (red, green and blue), pigment filter (with light resistance 107 lx*hour) : 48 dot/mm A4 (210 x 297 mm) size (shorter side) 1200 dpi US letter (8.5" x 11") size (shorter side) * Drive clock level : CMOS output under 5 V operation * Data rate * Power supply : 2 MHz MAX. : +15 V Voltage amplifiers * Photocell's pitch : 7 m * On-chip circuits : Reset feed-through level clamp circuits ORDERING INFORMATION Part Number Package CCD linear image sensor 36-pin ceramic DIP (600 mil) PD3719D The information in this document is subject to change without notice. Document No. S13492EJ1V0DS00(1st edition) Date published September 1998 N CP(K) Printed in Japan (c) 1998 PD3719 BLOCK DIAGRAM CLB 31 GND 3 GND 34 GND 32 GND 15 S10599 S10600 2 25 1 24 22 GND ****** Photocell (Blue) D14 D64 D65 D66 D67 S1 S2 Transfer gate VOUT1 33 (Blue) D14 23 TG CCD analog shift register S10599 S10600 21 D65 D66 D67 GND ****** Photocell (Green) D64 S1 VOUT2 (Green) 35 D14 Transfer gate CCD analog shift register 14 S10599 S2 GND ****** Photocell (Red) S10600 D64 D65 D66 Transfer gate VOUT3 (Red) 2 CCD analog shift register D67 S1 S2 4 VOD 5 6 VRD 12 13 RB 2 1 2 PD3719 PIN CONFIGURATION (Top View) CCD linear image sensor 36-pin ceramic DIP (600 mil) No connection Output signal 3 (Red) Ground Output drain voltage Reset gate clock Reset drain voltage No connection No connection No connection NC VOUT3 GND VOD 1 2 1 1 1 3 4 5 6 7 8 9 36 35 34 33 32 31 30 29 28 NC VOUT2 GND VOUT1 GND No connection Output signal 2 (Green) Ground Output signal 1 (Blue) Ground Reset feed-through level clamp clock No connection No connection No connection RB VRD NC NC NC CLB NC NC NC Green Blue Red No connection No connection Shift register clock 2 Shift register clock 1 Ground Ground No connection No connection No connection NC NC 10 11 12 13 14 15 10600 10600 10600 16 17 18 27 26 25 24 23 22 21 20 19 NC NC No connection No connection Shift register clock 2 Shift register clock 1 Transfer gate clock Ground Ground No connection No connection 2 1 GND GND NC NC NC 2 1 TG GND GND NC NC 3 PD3719 PHOTOCELL STRUCTURE DIAGRAM PHOTOCELL ARRAY STRUCTURE DIAGRAM (Line spacing) 7 m Blue photocell array 10 lines (70 m) 4 m 3 m 7 m Green photocell array 7 m Channel stopper 7 m Red photocell array 10 lines (70 m) Aluminum shield 4 PD3719 ABSOLUTE MAXIMUM RATINGS (TA = +25 C) Parameter Output drain voltage Reset drain voltage Shift register clock voltage Reset gate clock voltage Reset feed-through level clamp clock voltage Transfer gate clock voltage Operating ambient temperature Storage temperature VOD VRD V1, V2 VRB VCLB VTG TA Tstg Symbol Ratings -0.3 to +16 -0.3 to +16 -0.3 to +8 -0.3 to +8 -0.3 to +8 -0.3 to +8 -25 to +60 -40 to +100 Unit V V V V V V C C Caution Exposure to ABSOLUTE MAXIMUM RATINGS for extended periods may affect device reliability; exceeding the ratings could cause permanent damage. The parameters apply independently. RECOMMENDED OPERATING CONDITIONS (TA = +25 C) Parameter Output drain voltage Reset drain voltage Shift register clock high level Shift register clock low level Reset gate clock high level Reset gate clock low level Reset feed-through level clamp clock high level Reset feed-through level clamp clock low level Transfer gate clock high level Transfer gate clock low level Data rate VOD VRD V1H, V2H V1L, V2L VRBH VRBL VCLBH VCLBL VTGH VTGL fRB Symbol MIN. 14.0 14.0 4.5 -0.3 4.5 -0.3 4.5 -0.3 4.5 -0.3 - TYP. 15.0 VOD 5.0 0 5.0 0 5.0 0 V1HNote 0 1 MAX. 16.0 VOD 5.5 +0.5 5.5 +0.5 5.5 +0.5 V1HNote +0.3 2 Unit V V V V V V V V V V MHz Note When Transfer gate clock high level (VTGH) is higher than Shift register clock high level (V1H), Image lag can increase. 5 PD3719 ELECTRICAL CHARACTERISTICS TA = +25 C, VOD = 15 V, VRD = 15 V, data rate (fRB) = 2 MHz, storage time = 5.5 ms, light source: 3200 K halogen lamp +C-500S (infrared cut filter, t = 1mm), input signal clock = 5 Vp-p Parameter Saturation voltage Saturation exposure Red Green Blue Photo response non-uniformity Average dark signal Dark signal non-uniformity Power consumption Output impedance Response Red Green Blue Image lag Offset level Note1 Note2 Symbol Vsat SER SEG SEB PRNU ADS DSNU PW ZO RR RG RB IL VOS td TTE Red Green Blue Test Conditions MIN. 4.0 TYP. 5.0 0.52 0.57 0.94 MAX. - Unit V lx*s lx*s lx*s VOUT = 2.5 V Light shielding Light shielding 6 0.8 1.5 400 0.5 6.8 6.2 3.8 9.7 8.8 5.3 2.0 8.8 10.8 70 92 98 630 540 460 20 3.0 5.0 600 1 12.6 11.4 6.8 5.0 12.8 % mV mV mW k V/lx*s V/lx*s V/lx*s % V ns % nm nm nm times times VOUT = 2.5 V Output fall delay time VOUT = 2.5 V VOUT = 2.5 V Total transfer efficiency Response peak Dynamic range DR1 DR2 Vsat /DSNU Vsat / Light shielding Light shielding 0 - 3333 10000 1500 0.5 2500 - Reset feed-through noise Random noise Note1 RFTN mV mV Notes 1. Refer to TIMING CHART 2. 2. When the fall time of 1 (t1) is the TYP. value (refer to TIMING CHART 2). 6 PD3719 INPUT PIN CAPACITANCE (TA = +25 C, VOD = VRD = 15 V) Parameter Shift register clock pin capacitance 1 Symbol C1 Pin name Pin No. 13 24 Shift register clock pin capacitance 2 C2 MIN. TYP. 1600 1600 1600 1600 15 15 200 MAX. Unit pF pF pF pF pF pF pF 1 2 12 25 Reset gate clock pin capacitance Reset feed-through level clamp clock pin capacitance Transfer gate clock pin capacitance CRB CCLB CTG RB CLB TG 5 31 23 Remark Pins 13 and 24 (1), 12 and 25 (2) are each connected inside of the device. 7 VOUT1 to VOUT3 Optical black (49 pixels) Valid photocell (10600 pixels) Invalid photocell (2 pixels) Note Input the RB and CLB pulses continuously during this period, too. 10663 10664 10665 10666 10667 10668 10669 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 61 62 63 64 65 66 8 TIMING CHART 1 (for each color) TG 1 2 RB CLB Note Note Invalid photocell (3 pixels) PD3719 TIMING CHART 2 (for each color) t1 t2 1 90 % 10 % 2 t5 t6 90 % 10 % t3 t4 RB 90 % 10 % t10 90 % 10 % t8 t7 t9 t11 CLB td VOUT1 to VOUT3 RFTN VOS 10 % PD3719 9 PD3719 TG, 1, 2 TIMING CHART t12 90 % t14 t13 TG 10 % t15 90 % t16 1 2 Symbol t1, t2 t3 t4 t5, t6 t7 t8, t9 t10 t11 t12, t13 t14 t15, t16 MIN. 0 30 70 0 30 0 10 5 0 3000 900 TYP. 25 50 150 25 75 25 20 10 50 10000 1000 MAX. -- -- -- -- -- -- -- -- -- -- -- Unit ns ns ns ns ns ns ns ns ns ns ns Remark TYP. is an example of at 1 MHz data rate (fRB) operation. 1, 2 cross points 1 2 V or more 2 V or more 2 Remark Adjust cross points of 1 and 2 with input resistance of each pin. 10 PD3719 DEFINITIONS OF CHARACTERISTIC ITEMS 1. Saturation voltage: Vsat Output signal voltage at which the response linearity is lost. 2. Saturation exposure: SE Product of intensity of illumination (IX) and storage time (s) when saturation of output voltage occurs. 3. Photo response non-uniformity: PRNU The output signal non-uniformity of all the valid pixels when the photosensitive surface is applied with the light of uniform illumination. This is calculated by the following formula. PRNU (%) = x x 100 x x : maximum of xj - x 10600 j=1 xj x= 10600 xj : Output voltage of valid pixel number j VOUT Register Dark DC level x x 4. Average dark signal: ADS Average output signal voltage of all the valid pixels at light shielding. This is calculated by the following formula. 10600 ADS (mV) = dj j=1 dj : Dark signal of valid pixel number j 10600 5. Dark signal non-uniformity: DSNU Absolute maximum of the difference between ADS and voltage of the highest or lowest output pixel of all the valid pixels at light shielding. This is calculated by the following formula. DSNU (mV) : maximum of dj - ADS j = 1 to 10600 dj : Dark signal of valid pixel number j VOUT ADS Register Dark DC level DSNU 11 PD3719 6. Output impedance: ZO Impedance of the output pins viewed from outside. 7. Response: R Output voltage divided by exposure (Ix*s). Note that the response varies with a light source (spectral characteristic). 8. Image Lag: IL The rate between the last output voltage and the next one after read out the data of a line. TG Light ON OFF VOUT V1 VOUT V1 IL (%) = VOUT x100 9. Random noise: Random noise is defined as the standard deviation of a valid pixel output signal with 100 times (=100 lines) data sampling at dark (light shielding). 100 (mV) = (Vi - V) i=1 100 2 , V= 1 100 100 i=1 Vi Vi: A valid pixel output signal among all of the valid pixels for each color VOUT V1 V2 line 1 line 2 V100 This is measured by the DC level sampling of only the signal level, not by CDS (Correlated Double Sampling). ... line 100 ... 12 PD3719 STANDARD CHARACTERISTIC CURVES DARK OUTPUT TEMPERATURE CHARACTERISTIC 8 2 STORAGE TIME OUTPUT VOLTAGE CHARACTERISTIC (TA = +25 C) 4 Relative Output Voltage Relative Output Voltage 1 2 1 0.5 0.25 0.2 0.1 0 10 20 30 40 50 0.1 1 5 Storage Time (ms) 10 Operating Ambient Temperature TA(C) TOTAL SPECTRAL RESPONSE CHARACTERISTICS (without infrared cut filter) (TA = +25 C) 100 R B 80 G Response Ratio (%) 60 40 G 20 B 0 400 500 600 Wavelength (nm) 700 800 13 PD3719 APPLICATION CIRCUIT EXAMPLE +5 V 10 + 1 10 F/16 V 0.1 F B3 +15 V PD3719 NC VOUT3 GND VOD RB + 36 35 34 + 33 32 31 30 29 28 47 B1 NC VOUT2 GND VOUT1 GND CLB 2 3 4 0.1 F 47 F/25 V B2 +5 V RB 47 5 6 + 7 8 9 0.1F 10 F/16 V CLB VRD NC NC NC NC NC NC 47 F/25 V 10 11 2 NC NC 2 1 NC NC 2 1 TG 27 26 25 24 23 22 21 20 19 4.7 4.7 4.7 1 TG 4.7 4.7 12 13 14 15 16 17 18 GND GND NC NC NC GND GND NC NC Remark The inverters shown in the above application circuit example are the 74HC04. B1 to B3 EQUIVALENT CIRCUIT 15 V + 100 CCD VOUT 100 2SC945 47 F/25 V 2 k 14 PD3719 PACKAGE DRAWING CCD LINEAR IMAGE SENSOR 36-PIN CERAMIC DIP (600mil) (Unit : mm) 94.000.50 8.10.6 1 36.40.6 The 1st valid pixel 2 14.990.3 15.24 1.270.05 (4.33) (2.33) 3 0.460.05 88.90.6 2.54 20.32 2.00.3 4 0.250.05 3.500.5 0.970.3 3.300.35 Name Glass cap 1 The 1st valid pixel 2 The 1st valid pixel 3 The surface of the chip 4 The bottom of the package Dimensions 93.0 x 13.6 x 1.0 Refractive index 1.5 The center of the pin1 The center of the package The top of the glass cap (Reference) The surface of the chip 36D-1CCD-PKG-1 15 PD3719 NOTES ON THE USE OF THE PACKAGE The application of an excessive load to the package may cause the package to warp or break, or cause chips to come off internally. Particular care should be taken when mounting the package on the circuit board. When mounting the package, use a circuit board which will not subject the package to bending stress, or use a socket. For this product, the reference value for the three-point bending strengthNote is 30 kg. Avoid imposing a load, however, on the inside portion as viewed from the face on which the window (glass) is bonded to the package body (ceramic). Note Three-point bending strength test Distance between supports: 70 mm, Support R: R 2 mm, Loading rate: 0.5 mm / min. Load Load 70 mm 70 mm 16 PD3719 [MEMO] 17 PD3719 [MEMO] 18 PD3719 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be Semiconductor adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS device behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function. 19 PD3719 [MEMO] The application circuits and their parameters are for reference only and are not intended for use in actual design-ins. No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product. M4 96.5 |
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