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 (R)
VND670SP
DUAL HIGH SIDE SWITCH WITH DUAL POWER MOS GATE DRIVER (BRIDGE CONFIGURATION)
TYPE VND670SP
s s s
RDS(on) 30 m
IOUT 15 A
VDSS 40 V
OUTPUT CURRENT:15A PER CHANNEL
10
5V LOGIC LEVEL COMPATIBLE INPUTS GATE DRIVE FOR TWO EXTERNAL POWER MOS s UNDERVOLTAGE AND OVERVOLTAGE SHUT-DOWN s OVERVOLTAGE CLAMP s THERMAL SHUT DOWN s CROSS-CONDUCTION PROTECTION s CURRENT LIMITATION s VERY LOW STAND-BY POWER CONSUMPTION s PWM OPERATION UP TO 10 KHz s PROTECTION AGAINST: LOSS OF GROUND AND LOSS OF VCC s REVERSE BATTERY PROTECTION (*) DESCRIPTION The VND670SP is a monolithic device made using STMicroelectronics VIPower technology, intended for driving motors in full bridge BLOCK DIAGRAM
1
PowerSO-10TM
configuration. The device integrates two 30 m Power MOSFET in high side configuration, and provides gate drive for two external Power MOSFET used as low side switches. INA and INB allow to select clockwise or counter clockwise drive or brake; DIAGA/ENA, DIAGB/ENB allow to disable one half bridge and feedback diagnostic. Built-in thermal shut-down, combined with a current limiter, protects the chip in overtemperature and short circuit conditions. Short to battery protects the external connected low-side Power MOSFET.
V CC
Undervolt. INA
INTERNAL SUPPLY OUTA
INB LOGIC
Short to battery
DIAGA /ENA
Short to battery DIAGB /EN B
OUTB
GATEA PWM Overtemp. A Overtemp. B Current Limiter B Current Limiter A GND GATEB
(*) See note at page 5
June 2000
1/13
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VND670SP
ABSOLUTE MAXIMUM RATING
Symbol VCC Imax1 Imax2 IR IIN IEN Ipw Igs VESD Tj TSTG Parameter Supply voltage Maximum output current (continuous) Maximum output current (250 ms pulse duration) Reverse output current (continuous) Input current Enable pin current PWM pin current Output gate current Electrostatic discharge (R=1.5k, C=100pF) Junction operating temperature Storage temperature Value -0.3 .. 40 15 20 -15 +/- 10 +/- 10 +/- 10 +/- 20 2000 -40 to 150 -55 to 150 Unit V A A A mA mA mA mA V C C
CURRENT AND VOLTAGE CONVENTIONS
ICC IINA IINB IENA IENB INA INB DIAG A/ENA DIAGB/ENB PWM Ipw VCC VCC OUTA OUT B GATE A GATEB GND VgsB IgsB VgsA IgsA VOUTB IOUTB VOUTA IOUTA
VINA V INB V ENA VENB
Vpw
IGND
CONNECTION DIAGRAM (TOP VIEW)
INPUT B DIAGB/EN B PWM DIAGA/ENA INPUT A
6 7 8 9 10 11 VCC
5 4 3 2 1
OUTPUT B GATE B GROUND GATE A OUTPUT A
2/13
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VND670SP
THERMAL DATA
Symbol Rthj-case Rthj-amb (*) Parameter Thermal resistance junction-case (per channel) Thermal resistance junction-ambient (MAX) (MAX) Value 1.4 50 Unit C/W C/W
(*) When mounted using the recommended pad size on FR-4 board (See AN515 Application Note).
ELECTRICAL CHARACTERISTICS (VCC=9V up to 18V; -40CSymbol VCC RON Is Vgate Vgs,cl Parameter Operating supply voltage On state resistance Supply current Gate output voltage Gate output clamp voltage Test Conditions ILOAD=12A ILOAD=12A; Tj=25o C ON state OFF state Igs=-1 mA 5.0 6.8 Min 5.5 Typ Max 26 50 30 15 40 8.5 8.5 Unit V m m m A V V
26
7.4
SWITCHING (VCC=13V, RLOAD =1.1)
Symbol tD(on) tD(off) tr tf (dVOUT/dt)on (dVOUT/dt)off tdong trg tdoffg tfg tdel Parameter Turn-on delay time Turn-on delay time Output voltage rise time Output voltage fall time Turn-on voltage slope Turn-off voltage slope VgsTurn-on delay time Vgs rise time VgsTurn-off delay time Vgs fall time External MOSFET turn-on dead time Test Conditions Min Typ 50 45 50 40 160 230 0.5 2.6 1.0 2.2 600 Max 150 135 150 120 500 1200 2 10 5.0 10 1800 Unit s s s s V/ms V/ms s s s s s
Input rise time < 1s (see fig. 1)
C1=4.7nF Break to ground configuration (see fig. 2) (see fig. 3) 150
PROTECTION AND DIAGNOSTIC
Symbol VUSD VOV ILIM T TSD Vocl Vsat Parameter Undervoltage shut-down Overvoltage shut-down Current limitation Thermal shut-down temperature Output turn-off clamp voltage External MOSFET saturation voltage detection threshold Test Conditions Min 36 30 VIN = 3.25 V ILOAD=12A, L=6mH 150 VCC-55 2.5 4.2 Typ 43 45 170 200 VCC-41 5.5 Max 5.5 Unit V V A C V V
3/13
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VND670SP
ELECTRICAL CHARACTERISTICS (continued) PWM
Symbol Vpwl Ipwl Vpwh Ipwh Vpwhhyst Vpwcl Vpwtest Ipwtest Parameter PWM low level voltage PWM pin current PWM high level voltage PWM pin current PWM hysteresis voltage PWM clamp voltage Test Conditions Min Typ Max 1.5 Vpw=1.5V 1 3.25 Vpw=3.25V Ipw = 1 mA Ipw = -1 mA 0.5 VCC +0.3 -5.0 -3.5 -2000 VCC+0.7 -3.5 -2.0 -500 10 VCC +1.0 -2.0 -0.5 Unit V A V A V V V V A
Test mode PWM pin voltage Test mode PWM pin current Vpwtest = -2.0 V
LOGIC INPUT (INA/INB)
Symbol VIL IINL VIH IINH VIHYST VICL Parameter Input low level voltage Input current Input high level voltage Input current Input hysteresis voltage Input clamp voltage Test Conditions VIN=1.5 V VIN=3.25 V IIN=1mA IIN=-1mA 0.5 6.8 -1.0 7.4 -0.7 Min 1 3.25 10 8.5 -0.3 Typ Max 1.5 Unit V A V A V V V
ENABLE (LOGIC I/O PIN)
Symbol VENL IENL VENH IENH VEHYST VENCL Parameter Enable low level voltage Enable pin current Enable high level voltage Enable pin current Enable hysteresis voltage Test Conditions Normal operation (DIAGX/ENX pin acts as an input pin) VEN= 1.5 V Normal operation (DIAGX/ENX pin acts as an input pin) VEN= 3.25 V Normal operation (DIAGX/ENX pin acts as an input pin) IEN=1mA IEN=-1mA Fault operation (DIAGX/ENX pin acts as an input pin) IEN=1.6 mA Min Typ Max 1.5 1 3.25 10 0.5 6.8 -1.0 7.4 -0.7 8.5 -0.3 Unit V A V A V V V
Enable clamp voltage
VDIAG
Enable output low level voltage
0.4
V
4/13
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VND670SP
WAVEFORMS AND TRUTH TABLE TRUTH TABLE IN NORMAL OPERATING CONDITIONS
In normal operating conditions the DIAGX/ENX pin is considered as an input pin by the device. This pin must be externally pulled high. INA 1 1 0 0 X 1 0 X X INB 1 0 1 0 X X X 1 0 DIAGA/ENA 1 1 1 1 0 1 1 0 0 DIAGB/ENB 1 1 1 1 0 0 0 1 1 OUTA H H OPEN OPEN OPEN H OPEN OPEN OPEN OUTB H OPEN H OPEN OPEN OPEN OPEN H OPEN GATEA L L H H L L H L L GATEB L H L H L L L L H Comment Brake to VCC Clockwise Counter cw Brake to GND Stand by HSA only MOSA only HSB only MOSB only
PWM pin usage: In all cases, a "0" on the PWM pin will turn-off both GATEA and GATEB outputs. When PWM rises back to "1", GATEA or GATEB turn on again depending on the input pin state.
TYPICAL APPLICATION CIRCUIT FOR DC TO 10KHz PWM OPERATION
+5V R1 Rprot 1K DIAGA/EN A VCC +5V R1 Rprot 1K DIAGB/ENB
VND670SP
Rprot 1K
PWM
Rprot 1K
OUTA
GND Rgnd(*)
OUT B
INA
GATEA
INB
Rprot 1K
UP M DOWN
GATEB
External Power Mos A
External Power Mos B
(*) Reverse battery protection: - series relay in V CC line: Rgnd=0 Ohms - series fuse in VCC line with antiparallel diode between ground and VCC: Rgnd=10 Ohms.
5/13
VND670SP
TYPICAL APPLICATION CIRCUIT FOR A 20KHZ PWM OPERATION
+5V R1 Rprot 1K DIAGA/EN A VCC
+5V R1 Rprot 1K DIAGB/ENB
VND670SP
Rprot 1K
INA
OUTA Rgnd(*)
OUTB
Rprot 1K
PWM GATEA
UP M
D1 D2
INB
GATEB
Rprot 1K
DOWN
27 External Power Mos A External Power Mos B 27
(*) Reverse battery protection: - series relay in VCC line: Rgnd=0 Ohms - series fuse in VCC line with antiparallel diode between ground and VCC : Rgnd=10 Ohms.
6/13
VND670SP
WAVEFORMS AND TRUTH TABLE (CONTINUED)
In case of a fault condition the DIAGX/ENX pin is considered as an output pin by the device. The fault conditions are: - overtemperature on one or both high sides; - short to battery condition on the output (saturation detection on the external connected Power MOSFET). Possible origins of fault conditions may be: OUTA is shorted to ground ---> overtemperature detection on high side A. OUTA is shorted to VCC ---> external Power MOSFET saturation detection (driven by GATEA). When a fault condition is detected, the user can know which power element is in fault by monitoring the INA, INB, DIAGA/ ENA and DIAGB/ENB pins. In any case, when a fault is detected, the faulty half bridge is latched off. To turn-on the respective output (GATEX or OUTX) again, the input signal must rise from low to high level.
TRUTH TABLE IN FAULT CONDITIONS (detected on OUTA)
INA 1 1 0 0 X 1 0 X X INB 1 0 1 0 X X X 1 0 DIAGA/ENA 0 0 0 0 0 0 0 0 0 DIAGB/EN B 1 1 1 1 0 0 0 1 1 OUTA OPEN OPEN OPEN OPEN OPEN OPEN OPEN OPEN OPEN OUTB H OPEN H OPEN OPEN OPEN OPEN H OPEN GATEA L L L L L L L L L GATEB L H L H L L L L H
Fault Information TEST MODE
Protection Action
The PWM pin allows to test the load connection between two half-bridges. In the test mode (Vpwm=-2V) the external Power Mos gate drivers are disabled. The INA or INB inputs allow to turn-on the High Side A or B, respectively, in order to connect one side of the load at VCC voltage. The check of the voltage on the other side of the load allow to verify the continuity of the load connection. In case of load disconnection the DIADX/ENX pin corresponding to the faulty output is pulled down.
7/13
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VND670SP
ELECTRICAL TRANSIENT REQUIREMENTS
ISO T/R 7637/1 Test Pulse 1 2 3a 3b 4 5 ISO T/R 7637/1 Test Pulse 1 2 3a 3b 4 5 Class C E Test Level I -25V +25V -25V +25V -4V +26.5V Test Level II -50V +50V -50V +50V -5V +46.5V Test Level III -75V +75V -100V +75V -6V +66.5V Test Level IV -100V +100V -150V +100V -7V +86.5V Test Levels Result III C C C C C E Test Levels Delays and Impedance 2ms, 10 0.2ms, 10 0.1s, 50 0.1s, 50 100ms, 0.01 400ms, 2 Test Levels Result IV C C C C C E
Test Levels Result I C C C C C C
Test Levels Result II C C C C C E
Contents All functions of the device are performed as designed after exposure to disturbance. One or more functions of the device are not performed as designed after exposure to disturbance and cannot be returned to proper operation without replacing the device.
8/13
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VND670SP
Figure 1: Test conditions for High Side switching times measurement.
VOUTA, B 90%
80%
(dVOUT/dt)on 10%
(dVOUT/dt)off
t
VINA, B
td(on) tr
td(off) tf
t
Figure 2: Test conditions for external Power MOSFET switching times measurement.
VgsA, 90%
B
80%
10% Vpw tdong
20%
t
trg
tdoffg
tfg
t
Figure 3: Definition of the external Power MOSFET turn-on dead time tdel
INA
INB
OUTA
VgsA tdel
9/13
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VND670SP
Waveforms
NORMAL OPERATION (DIAGA/ENA=1, DIAGB/ENB=1)
DIAGA/ENA DIAGB/ENB INA INB PWM OUTA OUT B GATEA GATEB
NORMAL OPERATION (DIAGA/ENA=1, DIAGB /ENB=0 and DIAGA/ENA=0, DIAGB/ENB=1)
DIAGA/ENA DIAGB/ENB INA INB PWM OUTA OUTB GATE A GATEB
CURRENT LIMITATION/THERMAL SHUTDOWN or OUTA SHORTED TO GROUND
INA INB ILIM IOUTA TTSD
Tj
DIAGA/ENA DIAGB/ENB GATEA GATEB normal operation OUTA shorted to ground normal operation
10/13
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VND670SP
Waveforms (Continued)
OUTA shorted to VCC and undervoltage shutdown
INA INB OUTA OUTB GATE A GATEB DIAGB/ENB DIAGA/ENA normal operation OUTA shorted to VCC normal operation
undervoltage shutdown
Load disconnection test (INA=1, PWM=-2V)
INA INB PWM (test mode) OUTA OUT B GATEA GATE B DIAGA/ENA DIAGB/ENB load connected load disconnected load connected back
11/13
1
1
VND670SP
PowerSO-10TM MECHANICAL DATA
DIM. A A1 B c D D1 E E1 E2 E3 E4 e F H h L Q 0 1.20 1.70 8 1.25 13.80 0.50 1.80 0.047 0.067 mm. MIN. 3.35 0.00 0.40 0.35 9.40 7.40 9.30 7.20 7.20 6.10 5.90 1.27 1.35 14.40 0.049 0.543 0.002 0.070 TYP MAX. 3.65 0.10 0.60 0.55 9.60 7.60 9.50 7.40 7.60 6.35 6.10 MIN. 0.132 0.000 0.016 0.013 0.370 0.291 0.366 0.283 0.283 0.240 0.232 0.050 0.053 0.567 inch TYP. MAX. 0.144 0.004 0.024 0.022 0.378 0.300 0.374 0.291 300 0.250 0.240
B
0.10 A B
10 = H = A F A1 =
6
=
=
=
E = 1 5
=
E2
E3
E1
E4
=
=
=
=
SEATING PLANE DETAIL "A" Q
e
0.25
M
B
A
C
h
D = D1 = = = SEATING PLANE
A1
L DETAIL "A"
12/13
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VND670SP
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. The ST logo is a registered trademark of STMicroelectronics (c) 2000 STMicroelectronics - Printed in ITALY- All Rights Reserved. STMicroelectronics GROUP OF COMPANIES Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A. http://www.st.com
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