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MITSUBISHI LSIs 1998.11.30 Ver..B PRELIMINARY Notice: This is not a final specification. Some parametric limits are subject to change M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM PIN CONFIGURATION (TOP VIEW) DESCRIPTION The M5M54R08AJ is a family of 524288-word by 8-bit static RAMs, fabricated with the high performance CMOS silicon gate process and designed for high speed application. These devices operate on a single 3.3V supply, and are directly TTL compatible. They include a power down feature as well. FEATURES *Fast access time M5M54R08AJ-10 ... 10ns(max) M5M54R08AJ-12 ... 12ns(max) M5M54R08AJ-15 ... 15ns(max) *Single +3.3V power supply *Fully static operation : No clocks, No refresh *Common data I/O *Easy memory expansion by S *Three-state outputs : OR-tie capability *OE prevents data contention in the I/O bus *Directly TTL compatible : All inputs and outputs A0 A1 address A2 inputs A3 A4 chip select S input data inputs/ DQ1 outputs DQ2 (3.3V) VCC (0V) GND data DQ3 inputs/ outputs DQ4 write control W input A5 A6 address A7 inputs A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 NC A18 A17 address inputs A16 A15 output enable OE input data DQ8 inputs/ DQ7 outputs GND (0V) VCC (3.3V) DQ6 data inputs/ DQ5 outputs A14 A13 A12 A11 address inputs A10 NC Outline 36P0K (SOJ) APPLICATION High-speed memory units PACKAGE M5M54R08AJ : 36pin 400mil SOJ BLOCK DIAGRAM A0 A1 A2 address A4 inputs 1 2 3 4 5 MEMORY ARRAY 1024 ROWS 4096 COLUMNS 7 8 11 12 25 26 29 30 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 DQ8 data inputs/ outputs A3 A5 14 A6 15 A7 16 A8 17 A9 18 COLUMN I/O CIRCUITS S 6 COLUMN ADDRESS COLUMN DECODERS ADDRESS 9 27 10 28 W 13 DECODERS COLUMN INPUT BUFFERS VCC (3.3V) OE 31 GND (0V) 20 21 22 23 24 32 33 34 35 A10 A11 A12 A13 A14 A15 A16 A16 A17 address inputs MITSUBISHI ELECTRIC 1 MITSUBISHI LSIs M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM FUNCTION The operation mode of the M5M54R08AJ is determined by a combination of the device control inputs S, W and OE. Each mode is summarized in the function table. A write cycle is executed whenever the low level W overlaps with the low level S. The address must be set-up before the write cycle and must be stable during the entire cycle. The data is latched into a cell on the trailing edge of W or S, whichever occurs first, requiring the set-up and hold time relative to these edge to be maintained. The output enable input OE directly controls the output stage. Setting the OE at a high level, the output stage is in a high impedance state, and the data bus contention problem in the write cycle is eliminated. A read cycle is excuted by setting W at a high level and OE at a low level while S are in an active state (S=L). When setting S at high level, the chip is in a nonselectable mode in which both reading and writing are disable. In this mode, the output stage is in a highimpedance state, allowing OR-tie with other chips and memory expansion by S. Signal-S controls the power-down feature. When S goes high, power dissapation is reduced extremely. The access time from S is equivalent to the address access time. FUNCTION TABLE S H L L L W X L H H OE X X L H Mode Non selection Write Read DQ High-impedance Din Dout High-impedance Icc Stand by Active Active Active ABSOLUTE MAXIMUM RATINGS Symbol V cc VI VO Pd Topr T stg * Pulse Parameter Supply voltage Input voltage Output voltage Power dissipation Operating temperature Conditions With respect to GND Ratings - 2.0 * 4.6 ~ *~ VCC+0.5 - 2.0 - 2.0*~ VCC 1000 0 ~ 70 - 10 ~ 85 - 65 ~ 150 +10% - 5% Unit V V V mW C C C Ta=25C Tstg(bias) Storage temperature(bias) Storage temperature width3ns, In case of DC: - 0.5V DC ELECTRICAL CHARACTERISTICS (Ta=0 ~ 70C, Vcc=3.3V Symbol VIH VIL VOH VOL II I OZ Parameter High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage Input current Condition ,unless otherwise noted) Limits Min 2.0 2.4 0.4 2 2 Typ Max Vcc+0.3 0.8 Unit V V V V uA uA I OH = - 4mA IOL = 8mA VI= 0 ~ Vcc VI(S)=VIH Output current in off-state VI/O= 0 ~ Vcc Active supply current (TTL level) VI(S)=VIL other inpus=VIH or VIL Output-open(duty 100%) 10ns cycle AC 12ns cycle 15ns cycle DC 10ns cycle AC 12ns cycle 15ns cycle DC I CC1 I CC2 Stand by current (TTL level) VI(S)=VIH VI(S)=Vcc0.2V other inputs VI0.2V or VI Vcc - 0.2V 230 220 200 100 90 70 60 40 10 mA mA I CC3 Stand by current mA Note 1: Direction for current flowing into an IC is positive (no mark). MITSUBISHI ELECTRIC 2 MITSUBISHI LSIs M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM CAPACITANCE (Ta=0~70C, Vcc=3.3V Symbol CI CO Parameter Input capacitance Output capacitance +10% -5% ,unless otherwise noted) Test Condition Min Limit Typ Max 7 8 Unit pF pF V I =GND, V I =25mVrms,f=1MHz V O=GND, V O=25mVrms,f=1MHz Note 2: CI,CO are periodically sampled and are not 100% tested. AC ELECTRICAL CHARACTERISTICS (Ta=0~70C, Vcc=3.3V (1)MEASUREMENT CONDITION +10% -5% ,unless otherwise noted) Input pulse levels .................................... VIH=3.0V, VIL=0.0V Input rise and fall time .................................................... 3ns Input timing reference levels ........................ VIH=1.5V, VIL=1.5V Output timing reference levels ................. VOH =1.5V, VOL=1.5V Output loads ........................................................ Fig.1,Fig.2 5.0V OUTPUT Z0=50 DQ RL=50 VL=1.5V DQ 255 480 5pF (including scope and JIG) Fig.1 Output load Fig.2 Output load for ten , t dis MITSUBISHI ELECTRIC 3 MITSUBISHI LSIs M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM (2)READ CYCLE Limits Symbol Parameter M5M54R08AJ-10 M5M54R08AJ-12 M5M54R08AJ-15 Unit tCR ta(A) ta(S) ta(OE) tdis(S) tdis(OE) ten(S) ten(OE) tv(A) tPU tPD Read cycle time Address access time Chip select access time Output enable access time Output disable time after S high Output disable time after OE high Output enable time after S low Output enable time after OE low Data valid time after address change Power-up time after chip selection Power-down time after chip selection Min 10 Max 10 10 5 5 5 Min 12 Max 12 12 6 6 6 Min 15 Max 15 15 7 7 7 ns ns ns ns ns ns ns ns ns ns ns 0 0 2 0 2 0 0 0 3 1 3 0 0 0 3 1 3 0 10 12 15 (3)WRITE CYCLE Limits Symbol Parameter M5M54R08AJ-10 M5M54R08AJ-12 M5M54R08AJ-15 Unit Min tCW tw(W) tw(W) tsu(A)1 tsu(A)2 tsu(S) tsu(D) th(D) trec(W) tdis(W) tdis(OE) ten(W) ten(OE) tsu(A-WH) Write cycle time Write pulse width (OE low) Write pulse width(OE high) Address setup time(W) Address setup time(S) Chip select setup time Data setup time Data hold time Write recovery time Output disable time after W low Output disable time after OE high Output enable time after W high Output enable time after OE low Address to W High Max 10 10 8 0 0 8 5 0 1 0 0 0 0 8 5 5 Min 12 12 10 0 0 10 6 0 1 0 0 0 0 10 Max Min 15 15 10 0 0 10 7 0 1 0 0 0 0 10 Max ns ns ns ns ns ns ns ns ns ns ns ns ns ns 6 6 7 7 MITSUBISHI ELECTRIC 4 MITSUBISHI LSIs M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM (4)TIMING DIAGRAMS Read cycle 1 A 0~18 VIH VIL t CR ta(A) tv(A) tv(A) UNKNOWN DATA VALID PREVIOUS DATA VALID DQ1~8 VOH VOL W=H S=L OE=L Read cycle 2 (Note 3) t CR S VIH VIL ta(S) ten(S) (Note 4) tdis(S) (Note 4) DQ1~8 VOH VOL UNKNOWN DATA VALID tPU tPD 50% 50% Icc ICC1 ICC2 W=H OE=L Note 3. Addresses valid prior to or coincident with S transition low. 4. Transition is measured 500mv from steady state voltage with specified loading in Figure 2. Read cycle 3 (Note 5) OE VIH VIL t CR (Note 4) ta(OE) (Note 4) tdis(OE) ten(OE) UNKNOWN DATA VALID DQ1~8 VOH VOL W=H S=L Note 5. Addresses and S valid prior to OE transition low by (ta(A)-ta(OE)), (ta(S)-ta(OE)) MITSUBISHI ELECTRIC 5 MITSUBISHI LSIs M5M54R08AJ-10,-12,-15 4194304-BIT (524288-WORD BY 8-BIT) CMOS STATIC RAM Write cycle (W control mode) t CW A 0~18 S VIH VIL VIH VIL (Note 6) tsu(S) (Note 6) tsu(A-WH) OE VIH VIL tsu(A) tw(W) trec(W) W VIH VIL tsu(D) th(D) DQ1~8 (Input Data) VIH VIL DATA STABLE tdis(W) tdis(OE) (Note 4) ten(OE) ten(W) Hi-Z (Note 4) DQ1~8 (Output Data) VOH VOL Write cycle(S control) t CW A 0~18 VIH VIL tsu(A) tsu(S) trec(W) S VIH VIL tw(W) W VIH VIL (Note 6) (Note 6) tsu(D) th(D) DQ1~8 (Input Data) VIH VIL DATA STABLE ten(S) tdis(W) (Note 4) DQ1~8 (Output Data) VOH VOL (Note 4) Hi-Z (Note 7) Note 6: Hatching indicates the state is don't care. 7: When the falling edge of W is simultaneous or prior to the falling edge of S, the output is maintained in the high impedance. 8: ten,tdis are periodically sampled and are not 100% tested. MITSUBISHI ELECTRIC 6 |
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