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TLP191B TENTATIVE TOSHIBA Photocoupler GaAAs Ired & Photo-Diode Array TLP191B Telecommunication Programmable Controllers Mos Gate Driver MOS FET Gate Driver The TOSHIBA mini flat coupler TLP191B is a small outline coupler, suitable for surface mount assembly. The TLP191B consists of a GaAAs light emitting diode, optically coupled to a series connected photo diode array with shunt resistor which is suitable for MOS FET gate drive. * * * * Open voltage: 7.0V(min.) Short current: 24.0 A (min.) Isolation voltage: 2500 Vrms (min.) UL recognized: UL1577,file no.E67349 Unit in mm Maximum Ratings (Ta = 25C) Characteristic Forward current Forward current derating (Ta 25C) LED Pulse forward current (100s pulse, 100 pps) Reverse voltage Junction temperature Forward current Detector Reverse voltage Junction temperature Storage temperature range Operating temperature range Lead soldering temperature (10s) Isolation voltage (AC, 1 min., R.H. 60%) (Note) Symbol IF IF / C IFP VR Tj IFD VRD Tj Tstg Topr Tsol BVS Rating 50 -0.5 1 3 125 50 10 125 -55~125 -40~80 260 2500 Unit mA mA / C TOSHIBA Weight: 0.09 g 11-4C1 Pin Configuration(top view) A 1 6 V C A V C C C C Vrms 3 1 . Anode 3 . Cathode 4 . Cathode 6 . Anode 4 (Note) Device considered a two terminal device: Pins 1 and 3 shorted together and pins 4 and 6 shorted together. 1 2002-09-25 TLP191B Recommended Operating Conditions Characteristic Forward current Operating temperature Symbol IF Topr Min. -25 Typ. 20 Max. 25 85 Unit mA C Individual Electrical Characteristics (Ta = 25C) Characteristic Forward voltage LED Reverse current Capacitance Forward voltage Detector Reverse current Capacitance (anode to cathode) Symbol VF IR CT VFD IRD CTD Test Condition IF = 10 mA VR = 3 V V = 0, f = 1 MHz IFD = 10 A VRD = 10 V V = 0, f = 1 MHz Min. 1.2 -- -- -- -- -- Typ. 1.4 -- 30 7 7 -- Max. 1.7 10 60 -- -- -- Unit V A pF V A pF Coupled Electrical Characteristics (Ta = 25C) Characteristic Open voltage Short current Symbol VOC ISC Test Condition IF = 20 mA IF = 20 mA MIn. 7 24 Typ. 8 40 Max. -- -- Unit V A Isolation Characteristics (Ta = 25C) Characteristic Capacitance input to output Isolation resistance Symbol CS RS Test Condition VS = 0, f = 1 MHz VS = 500 V, R.H. 60% AC, 1 minute Isolation voltage BVS AC, 1 second in oil DC, 1 minute in oil Min. -- 5x10 10 Typ. 0.8 10 14 Max. -- -- -- -- -- Unit pF Vrms Vdc 2500 -- -- -- 5000 5000 Switching Characteristics (Ta = 25C) Characteristic Turn-on time Turn-off time Symbol tON tOFF Test Condition IF = 20mA, CL = 1000 pF Min. -- (Fig.1) -- Typ. 0.2 3 Max. -- -- Unit ms ms Fig. 1 Switching time test circuit IF CL VOUT 0V tON 5V 1V tOFF VOUT IF 2 2002-09-25 TLP191B IF - Ta 100 -4.0 -3.6 VF /Ta - IF Allowable forward current IF (mA) 80 Forward voltage temperature coefficient VF /Ta (mV / C) 0 20 40 60 80 100 -3.2 -2.8 -2.4 -2.0 -1.6 -1.2 -0.8 60 40 20 0 -20 0.1 0.3 0.5 1 3 5 10 30 Ambient temperature Ta (C) Forward current IF (mA) IF - VF 100 Ta = 25 C 5000 3000 IFP - DR Pulse width 100s Ta = 25 C 1000 500 300 (mA) 30 Forward current IF 10 Pulse forward current IFP 5 3 1 1.0 (mA) 50 100 50 30 1.2 1.4 1.6 1.8 10 2.0 2.2 3 10 -3 3 10 -2 3 10 -1 3 10 0 Forward voltage VF (V) Duty cycle ratio DR 10 9 8 7 6 5 4 3 2 1 0 1 VOC - IF Ta = 25 C 300 ISC - IF 100 (A) ISC Short current 55 C 85 C (V) 50 30 Open voltage VOC 10 5 3 55 C 1 85 C 1 3 5 10 30 50 100 Ta = 25 C 3 5 10 30 50 100 Forward current IF (mA) Forward current IF (mA) 3 2002-09-25 TLP191B RESTRICTIONS ON PRODUCT USE 000707EBC * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with domestic garbage. * The products described in this document are subject to the foreign exchange and foreign trade laws. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 4 2002-09-25 |
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