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www.fairchildsemi.com KA79MXX 3-Terminal 0.5A Negative Voltage Regulator Features * * * * * * No external components required Output current in excess of 0.5A Internal thermal overload Internal short circuit current limiting Output transistor safe area compensation Output voltages of -5V,-6V,-8V, -12V,-15V,-18V,-24V Description The KA79MXX series of 3-Terminal medium current negative voltage regulators are monolithic integrated circuits designed as fixed voltage regulators. These regulators employ internal current limiting, thermal shutdown and safe area compensation making them essentially indestructible. TO-220 1 D-PAK 1 1. GND 2. Input 3. Output Schematic Diagram Rev. 1.0.0 (c)2001 Fairchild Semiconductor Corporation KA79MXX Absolute Maximum Ratings Parameter Input Voltage(for VO = -5V to -18V) (for VO = -24V) Thermal Resistance Junction-Cases Thermal Resistance Junction-Air Operating Temperature Range Storage Temperature Range Symbol VI VI RJC RJA TOPR TSTG Value -35 -40 5 65 0 ~ +125 -65 ~ +125 Unit V V C /W C /W C C Electrical Characteristics (KA79M05/KA79M05R) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI =-10V,unless otherwise specified, CI =0.33F,CO=0.1F) Parameter Output Voltage Symbol VO Conditions TJ= +25 C IO = 5mA to 350mA VI = -V7 to -25V TJ =+25C VI= -7V to -25V VI= -8V to -25V Min. -4.8 -4.75 54 Typ. -5 -5 7.0 2.0 30 3.0 -0.2 40 60 1.1 140 650 Max. -5.2 -5.25 50 30 100 6.0 0.4 0.4 mA mV/ C V dB V mA mA V Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ Vo/T VN RR VD ISC IPK mV mV mA IO = 5mA to 500mA TJ = +25 C TJ= +25 C IO = 5mA to 350mA IO = 200mA VI = -8V to -25V IO = 5mA f = 10Hz, 100KHz TA = +25 C f = 120Hz VJ= -8Vto -18V TJ =+25 C, IO = 500mA TJ= +25 C, VI = -35V TJ= +25 C 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 2 KA79MXX Electrical Characteristics (KA79M06) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -11V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -8.0V to -25V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -8V to -25V IO = 5mA f = 10Hz to 100KHz,TA = +25 C f = 120Hz,VI = -9V to -19V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ= +25 C VI = -8Vto -25V VI = -9V to -19V IO = 5.0mA to 500mA Conditions Min. - 5.75 - 5.7 54 Typ. - 6.0 - 6.0 7.0 2.0 30 3 0.4 50 60 1.1 140 650 Max. - 6.25 V - 6.3 60 40 120 6 0.4 0.4 mA mV/ C V dB V mA mA mV mV mA Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ VO/T VN RR VD ISC IPK 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 3 KA79MXX Electrical Characteristics (KA79M08/KA79M08R) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -14V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -10.5V to -25V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -8V to -25V IO = 5mA f = 10Hz to 100KHz,TA = +25 C f = 120Hz,VI = -9V to -19V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ = +25 C VI = -10.5V to -25V VI = -11V to -21V IO = 5.0mA to 500mA Conditions Min. - 7.7 - 7.6 54 Typ. - 8.0 - 8.0 7.0 2.0 30 3 -0.6 60 59 1.1 140 650 Max. - 8.3 V - 8.4 80 50 160 6 0.4 0.4 mA mV/ C V dB V mA mA mV mV mA Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ VO/T VN RR VD ISC IPK 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 4 KA79MXX Electrical Characteristics (KA79M12) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -19V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -14.5V to -30V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -14.5V to -30V IO = 5mA f = 10Hz to 100KHz,TA =+25 C f = 120Hz,VI = -15V to -25V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ= +25 C VI = -14.5V to -30V VI = -15V to -25V IO = 5.0mA to 500mA Conditions Min. -11.5 -11.4 54 Typ. -12 -12 8.0 3.0 30 3 -0.8 75 60 1.1 140 650 Max. -12.5 V -12.6 80 50 240 6 0.4 0.4 mA mV/ C V dB V mA mA mV mV mA Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ VO/T VN RR VD ISC IPK 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 5 KA79MXX Electrical Characteristics (KA79M15) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -23V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -17.5V to -30V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -17.5V to -28V IO = 5mA f = 10Hz to 100KHz,TA = +25 C f = 120Hz,VI = -18.5V to -28.5V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ= +25 C VI = -17.5Vto -30V VI = -18V to -28V IO = 5.0mA to 500mA Conditions Min. - 14.4 -14.25 54 Typ. - 15 - 15 9.0 5.0 30 3 -1.0 90 59 1.1 140 650 Max. - 15.6 -15.75 80 50 240 6 0.4 0.4 mA mV/ C V dB V mA mA V Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ VO/T VN RR VD ISC IPK mV mV mA 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 6 KA79MXX Electrical Characteristics (KA79M18) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -27V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -21V to -33V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -21V to -33V IO = 5mA f = 10Hz to 100KHz,TA = +25 C f = 120Hz,VI = -22V to -32V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ= +25 C VI = -21V to -33V VI = -24V to -30V IO = 5.0mA to 500mA Conditions Min. - 17.3 - 17.1 54 Typ. - 18 - 18 9.0 5.0 30 3 -1.0 110 59 1.1 140 650 Max. - 18.7 - 18.9 80 80 360 6 0.4 0.4 mA mV/ C V dB V mA mA V Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note; VO VO IQ IQ VO/T VN RR VD ISC IPK mV mV mA 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 7 KA79MXX Electrical Characteristics (KA79M24) (Refer to test circuit, 0 C TJ +125 C, lO =350mA, VI = -33V,unless otherwise specified) Parameter Output Voltage Symbol TJ= +25 C VO IO = 5mA to 350mA VI = -27V to -38V TJ =+25C TJ= +25 C TJ= +25 C IO = 5mA to 350mA VI = -27V to -38V IO = 5mA f = 10Hz to 100KHz,TA = +25 C f = 120Hz,VI = -28V to -38V IO = 500mA, TJ = +25 C VI = -35V, TJ = +25 C TJ= +25 C VI = -27V to -38V VI = -30V to -36V IO = 5.0mA to 500mA Conditions Min. - 23 - 22.8 54 Typ. - 24 - 24 9.0 5.0 30 3 -1.0 180 58 1.1 140 650 Max. - 25 - 25.2 80 70 300 6 0.4 0.4 mA mV/ C V dB V mA mA V Unit Line Regulation (Note1) Load Regulation (Note1) Quiescent Current Quiescent Current Change Output Voltage Drift Output Noise Voltage Ripple Rejection Dropout Voltage Short Circuit Current Peak Current Note: VO VO IQ IQ VO/T VN RR VD ISC IPK mV mV mA 1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be taken into account separately. Pulse testing with low duty is used. 8 KA79MXX Typical Applications Figure 1. Fixed Output Regulator Figure 2. Variable Output Notes: 1. Required for stability. For value given, capacitor must be solid tantalum. 25F aluminum electrolytic may be substituted. 2. C2 improves transient response and ripple rejection. Do not increase beyond 50F. 9 KA79MXX Mechanical Dimensions Package Dimensions in millimeters TO-220 9.90 0.20 4.50 0.20 1.30 0.10 2.80 0.10 (8.70) o3.60 0.10 (1.70) 1.30 -0.05 +0.10 9.20 0.20 (1.46) 13.08 0.20 (1.00) (3.00) 15.90 0.20 1.27 0.10 1.52 0.10 0.80 0.10 2.54TYP [2.54 0.20] 2.54TYP [2.54 0.20] 10.08 0.30 18.95MAX. (3.70) (45 ) 0.50 -0.05 +0.10 2.40 0.20 10.00 0.20 10 KA79MXX Mechanical Dimensions (Continued) Package Dimensions in millimeters D-PAK 6.60 0.20 5.34 0.30 (0.50) (4.34) (0.50) 0.70 0.20 2.30 0.10 0.50 0.10 0.60 0.20 6.10 0.20 2.70 0.20 9.50 0.30 0.91 0.10 0.80 0.20 MAX0.96 2.30TYP [2.300.20] 0.76 0.10 2.30TYP [2.300.20] 0.89 0.10 0.50 0.10 1.02 0.20 2.30 0.20 (0.70) (0.90) (0.10) (3.05) 6.10 0.20 9.50 0.30 2.70 0.20 (2XR0.25) 0.76 0.10 (1.00) 6.60 0.20 (5.34) (5.04) (1.50) MIN0.55 11 KA79MXX Ordering Information Product Number KA79M05 KA79M06 KA79M08 KA79M12 KA79M15 KA79M18 KA79M24 KA79M05R KA79M08R KA79M12R D-PAK TO-220 0 ~ + 125C Package Operating Temperature 12 KA79MXX 13 KA79MXX DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. www.fairchildsemi.com 6/11/01 0.0m 001 Stock#DSxxxxxxxx 2001 Fairchild Semiconductor Corporation 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. |
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