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 CD54/74HC74, CD54/74HCT74
Data sheet acquired from Harris Semiconductor SCHS124A
January 1998 - Revised May 2000
Dual D Flip-Flop with Set and Reset Positive-Edge Trigger
Description
The 'HC74 and 'HCT74 utilize silicon gate CMOS technology to achieve operating speeds equivalent to LSTTL parts. They exhibit the low power consumption of standard CMOS integrated circuits, together with the ability to drive 10 LSTTL loads. This flip-flop has independent DATA, SET, RESET and CLOCK inputs and Q and Q outputs. The logic level present at the data input is transferred to the output during the positive-going transition of the clock pulse. SET and RESET are independent of the clock and are accomplished by a low level at the appropriate input. The HCT logic family is functionally as well as pin compatible with the standard LS logic family.
Features
[ /Title (CD54H C74, CD74H C74, CD74H CT74) /Subject Dual D liplop ith Set
* Hysteresis on Clock Inputs for Improved Noise Immunity and Increased Input Rise and Fall Times * Asynchronous Set and Reset * Complementary Outputs * Buffered Inputs * Typical fMAX = 50MHz at VCC = 5V, CL = 15pF, TA = 25oC * Fanout (Over Temperature Range) - Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads - Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads * Wide Operating Temperature Range . . . -55oC to 125oC * Balanced Propagation Delay and Transition Times * Significant Power Reduction Compared to LSTTL Logic ICs * HC Types - 2V to 6V Operation - High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V * HCT Types - 4.5V to 5.5V Operation - Direct LSTTL Input Logic Compatibility, VIL= 0.8V (Max), VIH = 2V (Min) - CMOS Input Compatibility, Il 1A at VOL, VOH
Ordering Information
PART NUMBER CD54HC74F CD54HC74F3A CD74HC74E CD74HC74M CD54HCT74F CD54HCT74F3A CD74HCT74E CD74HCT74M NOTES: 1. When ordering, use the entire part number. Add the suffix 96 to obtain the variant in the tape and reel. 2. Die is available which meets all electrical specifications. Please contact your local TI sales office or customer service for ordering information. TEMP. RANGE (oC) -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125 -55 to 125 PACKAGE 14 Ld CERDIP 14 Ld CERDIP 14 Ld PDIP 14 Ld SOIC 14 Ld CERDIP 14 Ld CERDIP 14 Ld PDIP 14 Ld SOIC
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright
(c) 2000, Texas Instruments Incorporated
1
CD54/74HC74, CD54/74HCT74 Pinout
CD54HC74, CD54HCT74 (CERDIP) CD74HC74, CD74HCT74 (PDIP, SOIC) TOP VIEW
1R 1 1D 2 1CP 3 1S 4 1Q 5 1Q 6 GND 7 14 VCC 13 2R 12 2D 11 2CP 10 2S 9 2Q 8 2Q
Functional Diagram
1 RESET 2 DATA 3 CLOCK 4 SET RESET 13 R D 11 CLOCK 10 F/F 2 CP S SET 8 Q GND = PIN 7 VCC = PIN 14 D F/F 1 CP S 6 Q R 5 Q
12 DATA
9 Q
TRUTH TABLE INPUTS SET L H L H H H RESET H L L H H H CP X X X D X X X H L X Q H L H (Note 3) H L Q0 OUTPUTS Q L H H (Note 3) L H Q0

L
NOTE: H = High Level (Steady State) L = Low Level (Steady State) X = Don't Care = Low-to-High Transition Q0 = the level of Q before the indicated input conditions were established. 3. This configuration is nonstable, that is, it will not persist when set and reset inputs return to their inactive (high) level.
2
CD54/74HC74, CD54/74HCT74
Absolute Maximum Ratings
DC Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V DC Input Diode Current, IIK For VI < -0.5V or VI > VCC + 0.5V . . . . . . . . . . . . . . . . . . . . . .20mA DC Drain Current, per Output, IO For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .25mA DC Output Diode Current, IOK For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .20mA DC Output Source or Sink Current per Output Pin, IO For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .25mA DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .50mA
Thermal Information
Thermal Resistance (Typical, Note 4) JA (oC/W) JC (oC/W) PDIP Package . . . . . . . . . . . . . . . . . . . 90 SOIC Package . . . . . . . . . . . . . . . . . . . 120 CERDIP Package . . . . . . . . . . . . . . . . 130 55 Maximum Junction Temperature (Hermetic Package or Die) . . . 175oC Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC (SOIC - Lead Tips Only)
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC Supply Voltage Range, VCC HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC Input Rise and Fall Time 2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max) 4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max) 6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE: 4. JA is measured with the component mounted on an evaluation PC board in free air.
DC Electrical Specifications
TEST CONDITIONS PARAMETER HC TYPES High Level Input Voltage VIH 2 4.5 6 Low Level Input Voltage VIL 2 4.5 6 High Level Output Voltage CMOS Loads High Level Output Voltage TTL Loads Low Level Output Voltage CMOS Loads Low Level Output Voltage TTL Loads Input Leakage Current II VCC or GND VOL VIH or VIL VOH VIH or VIL -0.02 2 4.5 6 -4 -5.2 0.02 4.5 6 2 4.5 6 4 5.2 4.5 6 6 1.5 3.15 4.2 1.9 4.4 5.9 3.98 5.48 0.5 1.35 1.8 0.1 0.1 0.1 0.26 0.26 0.1 1.5 3.15 4.2 1.9 4.4 5.9 3.84 5.34 0.5 1.35 1.8 0.1 0.1 0.1 0.33 0.33 1 1.5 3.15 4.2 1.9 4.4 5.9 3.7 5.2 0.5 1.35 1.8 0.1 0.1 0.1 0.4 0.4 1 V V V V V V V V V V V V V V V V V V A SYMBOL VI (V) IO (mA) VCC (V) MIN 25oC TYP MAX -40oC TO 85oC MIN MAX -55oC TO 125oC MIN MAX UNITS
3
CD54/74HC74, CD54/74HCT74
DC Electrical Specifications
(Continued) TEST CONDITIONS PARAMETER Quiescent Device Current HCT TYPES High Level Input Voltage Low Level Input Voltage High Level Output Voltage CMOS Loads High Level Output Voltage TTL Loads Low Level Output Voltage CMOS Loads Low Level Output Voltage TTL Loads Input Leakage Current Quiescent Device Current Additional Quiescent Device Current Per Input Pin: 1 Unit Load NOTE: 5. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA. II VCC and GND VCC or GND VCC - 2.1 VOL VIH or VIL VIH VIL VOH VIH or VIL 4.5 to 5.5 4.5 to 5.5 4.5 2 4.4 0.8 2 4.4 0.8 2 4.4 0.8 V V V SYMBOL ICC VI (V) VCC or GND IO (mA) VCC (V) 0 6 MIN 25oC TYP MAX 4 -40oC TO 85oC MIN MAX 40 -55oC TO 125oC MIN MAX 80 UNITS A
-0.02
4.5
3.98
-
-
3.84
-
3.7
-
V
-4 0.02
4.5 4.5
-
-
0.1 0.26
-
0.1 0.33
-
0.1 0.4
V V
4
5.5
-
0.1
-
1
-
1
A
ICC ICC (Note 5)
0 -
5.5 4.5 to 5.5
-
100
4 360
-
40 450
-
80 490
A A
HCT Input Loading Table
INPUT D R CP S UNIT LOADS 0.5 0.5 0.7 0.75
NOTE: Unit Load is ICC limit specified in DC Electrical Specifications table, e.g., 360A max at 25oC.
Prerequisite For Switching Specifications
PARAMETER HC TYPES Data to CP Setup Time (Figure 5) tSU 2 4.5 6 60 12 10 75 15 13 90 18 15 ns ns ns SYMBOL TEST CONDITIONS VCC (V) 25oC MIN TYP MAX -40oC TO 85oC -55oC TO 125oC MIN MAX MIN MAX UNITS
4
CD54/74HC74, CD54/74HCT74
Prerequisite For Switching Specifications
PARAMETER Hold Time (Figure 5) SYMBOL tH (Continued) VCC (V) 2 4.5 6 Removal Time R, S, to CP (Figure 5) tREM 2 4.5 6 Pulse Width R, S (Figure 1) tW 2 4.5 6 Pulse Width CP (Figure 1) tW 2 4.5 6 CP Frequency fMAX 2 4.5 6 HCT TYPES Data to CP Setup Time (Figure 6) Hold Time (Figure 6) Removal Time R, S, to CP (Figure 6) Pulse Width R, S (Figure 2) Pulse Width CP (Figure 2) CP Frequency tSU tH tREM tW tW fMAX 4.5 4.5 4.5 4.5 4.5 4.5 12 3 6 16 18 25 15 3 8 20 23 20 18 3 9 24 27 16 ns ns ns ns ns MHz 25oC MIN 3 3 3 30 6 5 80 16 14 80 16 14 6 30 35 TYP MAX -40oC TO 85oC -55oC TO 125oC MIN 3 3 3 40 8 7 100 20 17 100 20 17 5 25 29 MAX MIN 3 3 3 45 9 8 120 24 20 120 24 20 4 20 23 MAX UNITS ns ns ns ns ns ns ns ns ns ns ns ns MHz MHz MHz
TEST CONDITIONS -
Switching Specifications Input tr, tf = 6ns
PARAMETER HC TYPES Propagation Delay, CP to Q, Q (Figure 3) tPLH, tPHL CL = 50pF CL = 50pF CL = 15pF CL = 50pF Propagation Delay, R, S to Q, Q (Figure 3) tPLH, tPHL CL = 50pF CL = 50pF CL = 15pF CL = 50pF Transition Time (Figure 3) tTLH, tTHL CL = 50pF CL = 50pF CL = 50pF Input Capacitance CI 2 4.5 5 6 2 4.5 5 6 2 4.5 6 14 17 175 35 30 200 40 34 75 15 13 10 220 44 37 250 50 43 95 19 16 10 265 53 45 300 60 51 110 22 19 10 ns ns ns ns ns ns ns ns ns ns ns pF SYMBOL TEST CONDITIONS VCC (V) 25oC MIN TYP MAX -40oC TO 85oC -55oC TO 125oC MIN MAX MIN MAX UNITS
5
CD54/74HC74, CD54/74HCT74
Switching Specifications Input tr, tf = 6ns
PARAMETER CP Frequency Power Dissipation Capacitance (Notes 6, 7) HCT TYPES Propagation Delay, CP to Q, Q (Figure 4) Propagation Delay, R, S to Q, Q (Figure 4) Transition Time (Figure 4) Input Capacitance CP Frequency Power Dissipation Capacitance (Notes 6, 7) NOTES: 7. PD = CPD VCC2 fi + (CL VCC2 fo) where fi = input frequency, fo = output frequency, CL = output load capacitance, VCC = supply voltage. 6. CPD is used to determine the dynamic power consumption, per flip-flop. tPLH, tPHL tPHL, tPLH tTLH, tTHL CI fMAX CPD CL = 50pF CL = 50pF CL = 50pF CL = 15pF 4.5 4.5 4.5 5 5 50 30 35 40 15 10 44 50 19 10 53 60 22 10 ns ns ns pF MHz pF SYMBOL fMAX CPD (Continued) VCC (V) 5 5 25oC MIN TYP 50 25 MAX -40oC TO 85oC -55oC TO 125oC MIN MAX MIN MAX UNITS MHz pF
TEST CONDITIONS CL = 15pF -
Test Circuits and Waveforms
trCL CLOCK 90% 10% tfCL tWL + tWH = I fCL VCC 50% 10% tWL 50% 50% GND tWH CLOCK 2.7V 0.3V trCL = 6ns tWL + tWH = tfCL = 6ns I fCL 3V 1.3V 0.3V tWL 1.3V 1.3V GND tWH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table. For fMAX, input duty cycle = 50%. FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND PULSE WIDTH
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table. For fMAX, input duty cycle = 50%. FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND PULSE WIDTH
tr = 6ns INPUT 90% 50% 10%
tf = 6ns VCC
tr = 6ns INPUT GND 2.7V 1.3V 0.3V
tf = 6ns 3V
GND tTLH 90%
tTHL
tTLH 90% 50% 10% tPHL tPLH
tTHL
INVERTING OUTPUT
INVERTING OUTPUT tPHL tPLH
1.3V 10%
FIGURE 3. HC AND HCU TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC
6
CD54/74HC74, CD54/74HCT74 Test Circuits and Waveforms
trCL CLOCK INPUT 90% 10% tH(H) 50% GND tH(L) VCC DATA INPUT tSU(H) tTLH 90% OUTPUT tPLH tREM VCC SET, RESET OR PRESET tSU(L) tTHL 90% 50% 10% tPHL tREM 3V SET, RESET OR PRESET 50% GND tSU(H) tTLH OUTPUT 90% 1.3V tPLH 90% 1.3V 10% tPHL tSU(L) tTHL DATA INPUT tfCL VCC CLOCK INPUT
(Continued)
trCL 2.7V 0.3V tH(H) 1.3V GND tH(L) 3V 1.3V 1.3V 1.3V GND tfCL 3V
50% GND
1.3V GND
IC
CL 50pF
IC
CL 50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME, AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME, AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI's publication of information regarding any third party's products or services does not constitute TI's approval, warranty or endorsement thereof.
Copyright (c) 2000, Texas Instruments Incorporated


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