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Freescale Semiconductor Technical Data Document Number: MRF8P23080H Rev. 1, 11/2010 RF Power Field Effect Transistors N--Channel Enhancement--Mode Lateral MOSFETs Designed for W--CDMA and LTE base station applications with frequencies from 2300 to 2620 MHz. Can be used in Class AB and Class C for all typical cellular base station modulation formats. * Typical Doherty Single--Carrier W--CDMA Performance: VDD = 28 Volts, IDQA = 280 mA, VGSB = 0.7 Vdc, Pout = 16 Watts Avg., IQ Magnitude Clipping, Channel Bandwidth = 3.84 MHz, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. Frequency 2300 MHz 2350 MHz 2400 MHz Gps (dB) 14.6 14.7 14.6 D (%) 42.0 41.6 41.4 Output PAR (dB) 6.7 6.8 6.6 ACPR (dBc) --29.5 --31.5 --32.5 MRF8P23080HR3 MRF8P23080HSR3 2300-2400 MHz, 16 W AVG., 28 V W-CDMA, LTE LATERAL N-CHANNEL RF POWER MOSFETs * Capable of Handling 10:1 VSWR, @ 32 Vdc, 2350 MHz, 90 Watts CW Output Power (3 dB Input Overdrive from Rated Pout) * Typical Pout @ 3 dB Compression Point 100 Watts CW Features * Production Tested in a Symmetrical Doherty Configuration * 100% PAR Tested for Guaranteed Output Power Capability * Characterized with Large--Signal Load--Pull Parameters and Common Source S--Parameters * Internally Matched for Ease of Use * Integrated ESD Protection * Greater Negative Gate--Source Voltage Range for Improved Class C Operation * Designed for Digital Predistortion Error Correction Systems * RoHS Compliant * NI--780--4 in Tape and Reel. R3 Suffix = 250 Units, 56 mm Tape Width, 13 inch Reel. * NI--780S--4 in Tape and Reel. R3 Suffix = 250 Units, 32 mm Tape Width, 13 inch Reel. CASE 465M-01, STYLE 1 NI-780-4 MRF8P23080HR3 CASE 465H-02, STYLE 1 NI-780S-4 MRF8P23080HSR3 RFinA/VGSA 3 1 RFoutA/VDSA RFinB/VGSB 4 2 RFoutB/VDSB (Top View) Figure 1. Pin Connections Table 1. Maximum Ratings Rating Drain--Source Voltage Gate--Source Voltage Operating Voltage Storage Temperature Range Case Operating Temperature Operating Junction Temperature CW Operation @ TC = 25C Derate above 25C (1,2) Symbol VDSS VGS VDD Tstg TC TJ CW Value --0.5, +65 --6.0, +10 32, +0 --65 to +150 150 225 168 2.39 Unit Vdc Vdc Vdc C C C W W/C 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. (c) Freescale Semiconductor, Inc., 2010. All rights reserved. MRF8P23080HR3 MRF8P23080HSR3 1 RF Device Data Freescale Semiconductor Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 72C, 16 W CW, 28 Vdc, IDQA = 280 mA, VGSB = 0.7 V, 2300 MHz Case Temperature 80C, 80 W CW(3), 28 Vdc, IDQA = 280 mA, VGSB = 0.7 V, 2300 MHz Symbol RJC Value (1,2) 0.89 0.55 Unit C/W Table 3. ESD Protection Characteristics Test Methodology Human Body Model (per JESD22--A114) Machine Model (per EIA/JESD22--A115) Charge Device Model (per JESD22--C101) Class 2 (Minimum) A (Minimum) IV (Minimum) Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) Characteristic Off Characteristics (4) Symbol IDSS IDSS IGSS Min -- -- -- Typ -- -- -- Max 10 1 1 Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) On Characteristics (4) Gate Threshold Voltage (VDS = 10 Vdc, ID = 75 Adc) Gate Quiescent Voltage (VDD = 28 Vdc, IDA = 280 mAdc, Measured in Functional Test) Drain--Source On--Voltage (VGS = 10 Vdc, ID = 0.75 Adc) Adc Adc Adc VGS(th) VGS(Q) VDS(on) 1.0 1.9 0.1 1.8 2.6 0.23 2.5 3.4 0.3 Vdc Vdc Vdc Functional Tests (5,6) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 280 mA, VGSB = 0.7 Vdc, Pout = 16 W Avg., f = 2300 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured on 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Power Gain Drain Efficiency Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio (6) (In Gps D PAR ACPR 13.5 38.0 6.0 -- 14.6 42.0 6.7 --29.5 18.5 -- -- --27.0 dB % dB dBc Typical Broadband Performance Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 280 mA, VGSB = 0.7 Vdc, Pout = 16 W Avg., Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Frequency 2300 MHz 2350 MHz 2400 MHz Gps (dB) 14.6 14.7 14.6 D (%) 42.0 41.6 41.4 Output PAR (dB) 6.7 6.8 6.6 ACPR (dBc) --29.5 --31.5 --32.5 1. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 3. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table. 4. Each side of device measured separately. 5. Part internally matched both on input and output. 6. Measurement made with device in a Symmetrical Doherty configuration (continued) MRF8P23080HR3 MRF8P23080HSR3 2 RF Device Data Freescale Semiconductor Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Typical Performances (1) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 280 mA, VGSB = 0.7 Vdc, 2300--2400 MHz Bandwidth Pout @ 1 dB Compression Point, CW Pout @ 3 dB Compression Point, CW IMD Symmetry @ 20 W PEP, Pout where IMD Third Order Intermodulation 30 dBc (Delta IMD Third Order Intermodulation between Upper and Lower Sidebands > 2 dB) VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) Gain Flatness in 100 MHz Bandwidth @ Pout = 16 W Avg. Gain Variation over Temperature (--30C to +85C) Output Power Variation over Temperature (--30C to +85C) (2) P1dB P3dB IMDsym -- -- -- 55 100 30 -- -- -- W W MHz VBWres GF G P1dB -- -- -- -- 55 0.1 0.013 0.005 -- -- -- -- MHz dB dB/C dB/C 1. Measurement made with device in a Symmetrical Doherty configuration. 2. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table. MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 3 C6 VGA C5 C C4 C18 C15 C17 VDA C16 C2 Z1 C8 C3 C9 CUT OUT AREA C1 C13 C14 C20 C19 C7 R1 MRF8P23080H Rev. 1 C10 VGB C12 C11 P C21 C23 C24 C22 VDB Figure 2. MRF8P23080HR3(HSR3) Test Circuit Component Layout Table 5. MRF8P23080HR3(HSR3) Test Circuit Component Designations and Values Part C1, C7 C2, C8, C13, C19 C3, C9 C4, C5, C10, C11 C6, C12, C16, C22 C14, C20 C15, C21 C17, C23 C18, C24 R1 Z1 PCB Description 0.8 pF Chip Capacitors 1.0 pF Chip Capacitors 18 pF Chip Capacitors 8.2 pF Chip Capacitors 1.0 F, 50 V Chip Capacitors 10 pF Chip Capacitors 5.6 pF Chip Capacitors 10 F, 50 V Chip Capacitors 470 F, 63 V Electrolytic Capacitors 50 , 1/4 W Chip Resistor 2500 MHz Band 90, 3 dB Chip Hybrid Coupler 0.020, r = 3.5 Part Number ATC600F0R8JT250XT ATC600F1R0JT250XT ATC600F180JT250XT ATC600F8R2JT250XT GRM21BR71H105KA12L ATC600F100JT250XT ATC600F5R6JT250XT GRM55DR61H106KA88L MCGPR63V477M13X26--RH CRCW120650R0FKEA GSC356--HYB2500 RO4350B Manufacturer ATC ATC ATC ATC Murata ATC ATC Murata Multicomp Vishay Soshin Rogers MRF8P23080HR3 MRF8P23080HSR3 4 RF Device Data Freescale Semiconductor Single--ended 4 4 Quadrature combined 4 Doherty 2 2 Push--pull Figure 3. Possible Circuit Topologies MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 5 TYPICAL CHARACTERISTICS 14.9 14.8 Gps, POWER GAIN (dB) 14.7 14.6 14.5 14.4 14.3 14.2 14.1 14 2290 2305 2320 2335 2350 2365 2380 2395 Gps 3.84 MHz Channel Bandwidth, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF ACPR PARC VDD = 28 Vdc, Pout = 16 W (Avg.), IDQA = 280 mA VGSB = 0.7 Vdc, Single--Carrier W--CDMA 43 42 41 40 --26 --28 ACPR (dBc) --30 --32 --34 --36 2410 D, DRAIN EFFICIENCY (%) 0 --0.5 --1 --1.5 --2 --2.5 PARC (dB) --22 --24 --26 --28 --30 --32 --34 ACPR (dBc) D, DRAIN EFFICIENCY (%) 15 D 44 f, FREQUENCY (MHz) Figure 4. Output Peak- -Average Ratio Compression (PARC) -toBroadband Performance @ Pout = 16 Watts Avg. --20 --30 --40 --50 --60 --70 IMD, INTERMODULATION DISTORTION (dBc) VDD = 28 Vdc, Pout = 20 W (PEP) IDQA = 280 mA, VGSB = 0.7 Vdc IM3--U IM3--L Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2350 MHz IM5--U IM5--L IM7--U IM7--L 1 10 100 TWO--TONE SPACING (MHz) Figure 5. Intermodulation Distortion Products versus Two-Tone Spacing 17 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) 16 Gps, POWER GAIN (dB) 15 14 13 12 11 1 0 --1 --2 --3 --4 --5 --1 dB = 18.6 W --2 dB = 27.5 W --3 dB = 37.5 W PARC 10 20 30 40 50 60 Gps 60 55 50 45 40 35 30 VDD = 28 Vdc, IDQA = 280 mA, VGSB = 0.7 Vdc, f = 2350 MHz Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth, Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF D ACPR Pout, OUTPUT POWER (WATTS) Figure 6. Output Peak- -Average Ratio -toCompression (PARC) versus Output Power MRF8P23080HR3 MRF8P23080HSR3 6 RF Device Data Freescale Semiconductor TYPICAL CHARACTERISTICS 15 14 Gps, POWER GAIN (dB) 13 12 2350 MHz 11 10 9 1 2400 MHz VDD = 28 Vdc, IDQA = 280 mA, VGSB = 0.7 Vdc Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF 10 Pout, OUTPUT POWER (WATTS) AVG. 20 10 0 100 2350 MHz 2300 MHz 2300 MHz 2400 MHz Gps D ACPR 60 50 D, DRAIN EFFICIENCY (%) 40 30 0 --10 --20 --30 --40 --50 --60 ACPR (dBc) +ACPR in 3.84 MHz Integrated BW 1.8 3.6 Figure 7. Single-Carrier W-CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 18 15 12 GAIN (dB) 9 6 3 0 2050 VDD = 28 Vdc Pin = 0 dBm IDQA = 280 mA VGSB = 0.7 Vdc 2125 2200 2275 2350 2425 2500 2575 2650 Gain f, FREQUENCY (MHz) Figure 8. Broadband Frequency Response W-CDMA TEST SIGNAL 100 10 PROBABILITY (%) 1 Input Signal 0.1 (dB) 0.01 0.001 0.0001 W--CDMA. ACPR Measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Input Signal PAR = 7.5 dB @ 0.01% Probability on CCDF 0 1 2 3 4 5 6 7 8 9 10 PEAK--TO--AVERAGE (dB) 10 0 --10 --20 --30 --40 --50 --60 --70 --80 --90 --100 --9 --7.2 --5.4 --3.6 --1.8 0 5.4 7.2 9 f, FREQUENCY (MHz) --ACPR in 3.84 MHz Integrated BW 3.84 MHz Channel BW Figure 9. CCDF W-CDMA IQ Magnitude Clipping, Single-Carrier Test Signal Figure 10. Single-Carrier W-CDMA Spectrum MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 7 VDD = 28 Vdc, IDQA = 280 mA f MHz 2300 2350 2400 Max Pout (1) Watts 58 55 55 dBm 47.6 47.4 47.4 Zsource 8.42 -- j14.3 11.4 -- j13.4 17.7 -- j9.34 Zload 3.51 -- j5.02 3.75 -- j5.03 3.14 -- j5.63 (1) Maximum output power measurement reflects pulsed 1 dB gain compression. Zsource = Test circuit impedance as measured from gate contact to ground. Zload = Test circuit impedance as measured from drain contact to ground. Input Load Pull Tuner Device Under Test Output Load Pull Tuner Z source Z load Figure 11. Carrier Side Load Pull Performance -- Maximum P1dB Tuning VDD = 28 Vdc, IDQA = 280 mA f MHz 2300 2350 2400 Max Eff. (1) % 60.9 60.1 60.0 Zsource 8.41 -- j14.3 11.4 -- j13.4 17.7 -- j9.35 Zload 7.02 -- j3.44 6.84 -- j2.41 6.53 -- j2.92 (1) Maximum efficiency measurement reflects pulsed 1 dB gain compression. Zsource = Test circuit impedance as measured from gate contact to ground. Zload = Test circuit impedance as measured from drain contact to ground. Input Load Pull Tuner Device Under Test Output Load Pull Tuner Z source Z load Figure 12. Carrier Side Load Pull Performance -- Maximum Efficiency Tuning MRF8P23080HR3 MRF8P23080HSR3 8 RF Device Data Freescale Semiconductor ALTERNATIVE PEAK TUNE LOAD PULL CHARACTERISTICS VDD = 28 Vdc, IDQA = 280 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Ideal 54.5 53 Pout, OUTPUT POWER (dBm) 51.5 50 48.5 47 45.5 44 42.5 41 39.5 38 21 22.5 Actual 2400 MHz 2350 MHz 2300 MHz 2350 MHz 2400 MHz 2300 MHz 24 25.5 27 28.5 30 31.5 33 34.5 36 37.5 Pin, INPUT POWER (dBm) NOTE: Load Pull Test Fixture Tuned for Peak P1dB Output Power @ 28 V f (MHz) 2300 2350 2400 P1dB Watts 59 58 54 dBm 47.7 47.6 47.3 69 68 68 P3dB Watts dBm 48.4 48.3 48.3 Test Impedances per Compression Level f (MHz) 2300 2350 2400 P1dB P1dB P1dB Zsource 8.40 -- j14.3 11.4 -- j13.4 17.7 -- j9.30 Zload 3.60 -- j5.30 3.70 -- j5.20 3.10 -- j5.10 Figure 11. Pulsed CW Output Power versus Input Power @ 28 V NOTE: Measurement made on the Class AB, carrier side of the device. MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 9 PACKAGE DIMENSIONS MRF8P23080HR3 MRF8P23080HSR3 10 RF Device Data Freescale Semiconductor MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 11 MRF8P23080HR3 MRF8P23080HSR3 12 RF Device Data Freescale Semiconductor MRF8P23080HR3 MRF8P23080HSR3 RF Device Data Freescale Semiconductor 13 PRODUCT DOCUMENTATION AND SOFTWARE Refer to the following documents and software to aid your design process. Application Notes * AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins * EB212: Using Data Sheet Impedances for RF LDMOS Devices Software * Electromigration MTTF Calculator * RF High Power Model * .s2p File For Software, do a Part Number search at http://www.freescale.com, and select the "Part Number" link. Go to the Software & Tools tab on the part's Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision 0 1 Date May 2010 Nov. 2010 * Initial Release of Data Sheet * Updated frequency in overview paragraph from "2300 to 2400 MHz" to "2300 to 2620 MHz" to show the broadband performance of the part, p. 1 * In Table 2, Thermal Characteristics, Pout = 16 W CW thermal resistance value changed from 0.91 to 0.89_C/W and Pout = 80 W CW thermal resistance value changed from 0.91 to 0.55_C/W. Thermal values now reflect the use of the combined dissipated power from the carrier amplifier and peaking amplifier, p. 2. * Broadband IRL data removed from Fig. 4, Output Peak--to--Average Ratio Compression (PARC) Broadband Performance and Fig. 8, Broadband Frequency Response graphs. Data not valid indicator of product performance due to circuit implementation, p. 6, 7. Description MRF8P23080HR3 MRF8P23080HSR3 14 RF Device Data Freescale Semiconductor How to Reach Us: Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. Technical Information Center, EL516 2100 East Elliot Road Tempe, Arizona 85284 1--800--521--6274 or +1--480--768--2130 www.freescale.com/support Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) www.freescale.com/support Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1--8--1, Shimo--Meguro, Meguro--ku, Tokyo 153--0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor China Ltd. Exchange Building 23F No. 118 Jianguo Road Chaoyang District Beijing 100022 China +86 10 5879 8000 support.asia@freescale.com For Literature Requests Only: Freescale Semiconductor Literature Distribution Center 1--800--441--2447 or +1--303--675--2140 Fax: +1--303--675--2150 LDCForFreescaleSemiconductor@hibbertgroup.com Information in this document is provided solely to enable system and software implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. "Typical" parameters that may be provided in Freescale Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals", must be validated for each customer application by customer's technical experts. Freescale Semiconductor does not convey any license under its patent rights nor the rights of others. Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. (c) Freescale Semiconductor, Inc. 2010. All rights reserved. MRF8P23080HR3 MRF8P23080HSR3 Document Number: RF Device Data MRF8P23080H Rev. 1, 11/2010 Freescale Semiconductor 15 |
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