2SC5886 2002-08-21 1 toshiba transistor silicon npn epitaxial type 2SC5886 high-speed swtching applications dc-dc converter applications high dc current gain: h fe = 400 to 1000 (i c = 0.5 a) low collector-emitter saturation: v ce (sat) = 0.22 v (max) high-speed switching: t f = 55 ns (typ.) maximum ratings (ta = 25c) characteristics symbol rating unit collector-base voltage v cbo 100 v v cex 80 collector-emitter voltage v ceo 50 v emitter-base voltage v ebo 7 v dc i c 5 collector current pulse i cp 10 a base current i b 0.5 a ta 25c 1 collector power dissipation tc 25c pc 20 w junction temperature t j 150 c storage temperature range t stg 55 to 150 c electrical characteristics (ta = 25c) characteristics symbol test condition min typ. max unit collector cut-off current i cbo v cb 100 v, i e 0 100 na emitter cut-off current i ebo v eb 7 v, i c 0 100 na collector-emitter brakedown voltage v (br) ceo i c 10 ma, i b 0 50 v h fe (1) v ce 2 v, i c 0.5 a 400 1000 dc current gain h fe (2) v ce 2 v, i c 1.6 a 200 collector-emitter saturation voltage v ce (sat) i c 1.6 a, i b 32 ma 0.22 v base-emitter saturation voltage v be (sat) i c 1.6 a, i b 32 ma 1.10 v rise time t r 63 storage time t stg 560 switching time fall time t f see figure 1 circuit diagram v cc 24 v, r l 15 i b1 32 ma, i b2 53 ma 55 ns unit: mm jedec D jeita sc-64 toshiba 2-7j1a weight: 0.36 g (typ.)
2SC5886 2002-08-21 2 marking explanation of lot no. c5886 product no. lot no. month of manufacture: january to december are denoted by letters a to l respectively. year of manufacture: last decimal digit of the year of manufacture figure 1 switching time test circuit & timing chart i b2 i b1 20 s output input i b2 i b1 r l v cc duty cycle 1%
2SC5886 2002-08-21 3 0.001 0.01 0.01 0.1 1 3 0.03 0.1 10 1 0.05 0.3 0.5 3 5 0.3 0.003 0.03 common emitter tc 25c i c 2.5 a 1 a 2 a 0.001 10 0.01 0.1 1 10 100 1000 30000 10000 3000 5000 300 500 30 50 0.003 0.03 0.3 3 common emitter v ce 2 v tc 100c 55c 25c 0.001 0.01 0.01 0.1 1 10 0.1 1 30 10 3 5 0.3 0.5 0.03 0.05 0.003 0.03 0.3 3 common emitter i c /i b 50 tc 55c 100c 25c 0.001 0.001 0.01 0.1 1 10 0.01 0.1 3 1 0.3 0.5 0.03 0.05 0.003 0.005 0.003 0.03 0.3 3 common emitter i c /i b 50 tc 100c 55c 25c 0 0 0.5 1 1.5 1 2 common emitter v ce 2 v 55c tc 100c 25c collector current i c (a) base-emitter saturation voltage v be (sat) (v) collector-emitter voltage v ce (v) i c ? v ce collector current i c (a) collector current i c (a) h fe ? i c dc current gain h fe collector current i c (a) v ce (sat) ? i c collector emitter saturation voltage v ce (sat) (v) collector current i c (a) v be (sat) ? i c base-emitter voltage v be (v) i c ? v be base current i b (a) v ce ? i b collector-emitter saturation voltage v ce (v) 0 0 2 4 6 8 2 4 6 common emitter tc 25c 10 ma 5 ma 2 ma i b 1 ma 70 ma 50 ma 20 ma 30 ma 0
2SC5886 2002-08-21 4 pulse width t w (s) r th (j-c) ? t w collector-emitter voltage v ceo (v) safe operation area collector current i c (a) transient thermal resistance (junction- case) r th (j-c) (c/w) 0.001 0.5 0.01 0.1 1 3 10 50 1 5 30 10 0.003 0.03 0.3 3 tc 25c infinite heat sink curves should be applied in thermal limited area. (single nonrepetitive pulse) 0.1 0.01 1 10 100 0.1 1 10 100 0.03 0.05 0.3 0.5 3 5 30 50 * : single pulse tc 25c curves must be derated linealy with increase in temperature i c max (pulsed) * 10 s * 100 s * 1 ms * i c max (continuous) dc operation (tc 25c) 10 ms * 100 ms * v ceo max
2SC5886 2002-08-21 5 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707ea a restrictions on product use
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