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  final publication# 10205 rev: f amendment/ +2 issue date: august 1997 am27c010 1 megabit (131,072 x 8-bit) cmos eprom distinctive characteristics n fast access time 45 ns maximum access time n low power consumption 20 m a typical cmos standby current n jedec-approved pinout n single +5 v power supply n 10% power supply tolerance available n 100% flashrite programming typical programming time of 16 seconds n latch-up protected to 100 ma from ? v to v cc + 1 v n high noise immunity n versatile features for simple interfacing both cmos and ttl input/output compatibility two line control functions n compact 32-pin dip, pdip, tsop, plcc packages general description the am27c010 is a 1 megabit ultraviolet erasable pro- grammable read-only memory. it is organized as 128k words by 8 bits per word, operates from a single +5 v supply, has a static standby mode, and features fast single address location programming. products are available in windowed ceramic dip packages as well as plastic one time programmable (otp) pdip, tsop, and plcc packages. typically, any byte can be accessed in less than 45 ns, allowing high-performance microprocessors to oper- ate without wait states. the am27c010 offers sepa- rate output enable (oe ) and chip enable (ce ) controls, thus eliminating bus contention in a multiple bus microprocessor system. amds cmos process technology provides high speed, low power, and high noise immunity. typical power consumption is only 100 mw in active mode, and 100 m w in standby mode. all signals are ttl levels, including programming sig- nals. bit locations may be programmed singly, in blocks, or at random. the am27c010 supports amds flashrite programming algorithm (100 m s pulses) re- sulting in a typical programming time of 16 seconds. block diagram 10205f-1 a0?16 address inputs pgm ce oe v cc v ss v pp data outputs dq0?q7 output buffers y gating 1,048,576 bit cell matrix x decoder y decoder output enable chip enable and prog logic
2 am27c010 product selector guide connection diagrams top view pdip plcc notes: 1. jedec nomenclature is in parenthesis. 2. the 32-pin dip to 32-pin plcc con?uration varies from the jedec 28-pin dip to 32-pin plcc con?uration. tsop family part no: am27c010 ordering part no: v cc = 5.0 v 5% v cc = 5.0 v 10% -45 -255 -45 -55 -70 -90 -120 -150 -200 max access time (ns) 45 55 70 90 120 150 200 250 ce (e ) access (ns) 45 55 70 90 120 150 200 250 oe (g ) access (ns) 25 35 35 40 50 65 75 75 3 4 5 2 1 9 10 11 12 13 27 26 25 24 23 7 8 22 21 6 32 31 20 14 30 29 28 15 16 19 18 17 a6 a5 a4 a3 a2 a1 a0 a16 dq0 a15 a12 a7 dq1 dq2 v ss a8 a9 a11 oe (g) a10 ce (e) dq7 v cc pgm (p) dq6 nc a14 a13 dq5 dq4 dq3 v pp 10205f-2 5 6 7 8 9 10 11 12 13 17 18 19 20 16 15 14 29 28 27 26 25 24 23 22 21 a7 a6 a5 a4 a3 a2 a1 a0 dq0 dq1 dq2 v ss dq3 dq4 dq5 dq6 1 31 30 2 3 432 a14 a13 a8 a9 a11 oe (g) a10 ce (e) dq7 a12 a15 a16 v pp v cc pgm (p) nc 10205f-3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 standard pinout a11 a9 a8 a13 a14 nc pgm v cc v pp a16 a15 a12 a7 a6 a5 a4 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 oe a10 ce dq7 dq6 dq5 dq4 dq3 v ss dq2 dq1 dq0 a0 a1 a2 a3 10205f-4
am27c010 3 pin designations a0?16 = address inputs ce (e ) = chip enable input dq0?q7 = data input/outputs oe (g ) = output enable input pgm (p ) = program enable input v cc =v cc supply voltage v pp = program voltage input v ss = ground logic symbol 10205f- 5 a0?16 dq0?q7 ce (e ) pgm (p ) oe (g ) 8 17
4 am27c010 ordering information uv eprom products amd standard products are available in several packages and operating ranges. the order number (valid combination) is formed by a combination of: valid combinations valid combinations list con?urations planned to be sup- ported in volume for this device. consult the local amd sales of?e to con?m availability of speci? valid combinations and to check on newly released combinations. temperature range c = commercial (0 c to +70 c) i = industrial (?0 c to +85 c) e = extended (?5 c to +125 c) package type d = 32-pin ceramic dip (cdv032) device number/description am27c010 1 megabit (128k x 8-bit) cmos uv eprom am27c010 -45 d c optional processing blank = standard processing b = burn-in speed option see product selector guide and valid combinations b 5 voltage tolerance 5=v cc 5%, 45 ns only see product selector guide and valid combinations valid combinations am27c010-45 v cc = 5.0 v 5% dc5, dc5b, di5, di5b am27c010-45 v cc = 5.0 v 10% dc, dcb, di, dib am27c010-55 am27c010-70 am27c010-90 am27c010-120 dc, dcb, de, deb, di, dib am27c010-150 am27c010-200 am27c010-255 v cc = 5.0 v 5% dc, dcb, di, dib
am27c010 5 ordering information otp eprom products amd standard products are available in several packages and operating ranges. the order number (valid combination) is formed by a combination of: valid combinations valid combinations list con?urations planned to be sup- ported in volume for this device. consult the local amd sales of?e to con?m availability of speci? valid combinations and to check on newly released combinations. temperature range c = commercial (0 c to +70 c) i = industrial (?0 c to +85 c) package type p = 32-pin plastic dip (pd 032) j = 32-pin rectangular plastic leaded chip carrier (pl 032) e = 32-pin thin small outline package (tsop) standard pinout (ts 032) device number/description am27c010 1 megabit (128k x 8-bit) cmos otp eprom am27c010 -45 j c optional processing blank = standard processing speed option see product selector guide and valid combinations voltage tolerance 5=v cc 5%, -45 ns only see product selector guide and valid combinations 5 valid combinations am27c010-45 v cc = 5.0 v 5% pc5, pi5, jc5, ji5, ec5, ei5 am27c010-45 v cc = 5.0 v 10% pc, pi, jc, ji, ec, ei am27c010-55 am27c010-70 am27c010-90 am27c010-120 am27c010-150 am27c010-200 am27c010-255 v cc = 5.0 v 5%
6 am27c010 functional description erasing the am27c010 in order to clear all locations of their programmed con- tents, it is necessary to expose the am27c010 to an ultraviolet light source. a dosage of 15 w seconds/ cm 2 is required to completely erase an am27c010. this dosage can be obtained by exposure to an ultra- violet lamp ?wavelength of 2537 ? ?with intensity of 12,000 m w/cm 2 for 15 to 20 minutes. the am27c010 should be directly under and about one inch from the source and all ?ters should be removed from the uv light source prior to erasure. it is important to note that the am27c010, and similar devices, will erase with light sources having wave- lengths shorter than 4000 ?. although erasure times will be much longer than with uv sources at 2537?, ex- posure to ?orescent light and sunlight will eventually erase the am27c010 and exposure to them should be prevented to realize maximum system reliability. if used in such an environment, the package window should be covered by an opaque label or substance. programming the am27c010 upon delivery, or after each erasure, the am27c010 has all 1,048,576 bits in the ?ne? or high state. zeros are loaded into the am27c010 through the procedure of programming. the programming mode is entered when 12.75 v 0.25v is applied to the v pp pin, ce and pgm are at v il and oe is at v ih . for programming, the data to be programmed is applied 8 bits in parallel to the data output pins. the flashrite algorithm reduces programming time by using 100 m s programming pulse and by giving each address only as many pulses as are necessary in order to reliably program the data. after each pulse is applied to a given address, the data in that address is veri?d. if the data does not verify, additional pulses are given until it veri?s or the maximum is reached. this process is repeated while sequencing through each address of the am27c010. this part of the algorithm is done at v cc = 6.25 v to assure that each eprom bit is pro- grammed to a suf?iently high threshold voltage. after the nal address is completed, the entire eprom memory is veri?d at v cc = v pp = 5.25 v. please refer to section 6 for programming ?w chart and characteristics. program inhibit programming of multiple am27c010s in parallel with different data is also easily accomplished. except for ce , all like inputs of the parallel am27c010 may be common. a ttl low-level program pulse applied to an am27c010 ce input and v pp = 12.75 v 0.25 v, pgm low, and oe high will program that am27c010. a high-level ce input inhibits the other am27c020s from being programmed. program verify a verify should be performed on the programmed bits to determine that they were correctly programmed. the verify should be performed with oe and ce at v il , pgm at v ih , and v pp between 12.5 v and 13.0 v. auto select mode the auto select mode allows the reading out of a binary code from an eprom that will identify its manufacturer and type. this mode is intended for use by program- ming equipment for the purpose of automatically matching the device to be programmed with its corre- sponding programming algorithm. this mode is func- tional in the 25 c 5 c ambient temperature range that is required when programming the am27c010. to activate this mode, the programming equipment must force 12.0 v 0.5 v on address line a9 of the am27c010. two identi?r bytes may then be se- quenced from the device outputs by toggling address line a0 from v il to v ih . all other address lines must be held at v il during auto select mode. byte 0 (a0 = v il ) represents the manufacturer code, and byte 1 (a0 = v ih ), the device identi?r code. for the am27c010, these two identi?r bytes are given in the mode select table. all identi?rs for manufacturer and device codes will possess odd parity, with the msb (dq7) de?ed as the parity bit. read mode the am27c010 has two control functions, both of which must be logically satis?d in order to obtain data at the outputs. chip enable (ce ) is the power control and should be used for device selection. output enable (oe ) is the output control and should be used to gate data to the output pins, independent of device selec- tion. assuming that addresses are stable, address ac- cess time (t acc) is equal to the delay from ce to output (t ce ). data is available at the outputs t oe after the fall- ing edge of oe , assuming that ce has been low and addresses have been stable for at least t acc ?t oe . standby mode the am27c010 has a cmos standby mode which re- duces the maximum v cc current to 100 m a. it is placed in cmos-standby when ce is at v cc 0.3 v. the am27c010 also has a ttl-standby mode which re- duces the maximum v cc current to 1.0 ma. it is placed in ttl-standby when ce is at v ih . when in standby mode, the outputs are in a high-impedance state, inde- pendent of the oe input.
am27c010 7 output or-tieing to accommodate multiple memory connections, a two-line control function is provided to allow for: n low memory power dissipation n assurance that output bus contention will not occur it is recommended that ce be decoded and used as the primary device-selecting function, while oe be made a common connection to all devices in the array and connected to the read line from the system con- trol bus. this assures that all deselected memory de- vices are in their low-power standby mode and that the outut pins are only active when data is desired from a particular memory device. system applications during the switch between active and standby condi- tions, transient current peaks are produced on the rising and falling edges of chip enable. the magni- tude of these transient current peaks is dependent on the output capacitance loading of the device. at a min- imum, a 0.1 m f ceramic capacitor (high frequency, low inherent inductance) should be used on each device between v cc and v ss to minimize transient effects. in addition, to overcome the voltage drop caused by the inductive effects of the printed circuit board traces on eprom arrays, a 4.7 m f bulk electrolytic capacitor should be used between v cc and v ss for each eight devices. the location of the capacitor should be close to where the power supply is connected to the array. mode select table notes: 1. v h = 12.0 v 0.5 v. 2. x = either v ih or v il. 3. a1?8 = a10?16 = v il . 4. see dc programming characteristics for v pp voltage during programming. ce oe pgm a0 a9 v pp outputs read v il v il xxxxd out output disable x v ih xxxx high-z standby (ttl) v ih xxxxx high-z standby (cmos) v cc 0.3 v xxxxx high-z program v il v ih v il xxv pp d in program verify v il v il v ih xxv pp d out program inhibit v ih xxxxv pp high-z auto select (note 3) manufacturer code v il v il xv il v h x 01h device code v il v il xv ih v h x0e pins mode
8 am27c010 absolute maximum ratings storage temperature otp products . . . . . . . . . . . . . . . . ?5 c to +125 c all other products. . . . . . . . . . . . . ?5 c to +150 c ambient temperature with power applied. . . . . . . . . . . . . .?5 c to + 125 c voltage with respect to v ss all pins except a9, v pp , v cc . . ?.6 v to v cc +0.5 v a9 and v pp (note 2). . . . . . . . . . . . . ?.6 v to +13.5 v v cc (note 1). . . . . . . . . . . . . . . . . . . . ?.6 v to +7.0 v notes: 1. minimum dc voltage on input or i/o pins is ?.5 v. during voltage transitions, inputs may overshoot v ss to ?.0 v for periods of up to 20 ns. maximum dc voltage on input and i/o pins is v cc + 0.5 v. during voltage transitions, input and i/o pins may overshoot to v cc + 2.0 v for periods up to 20ns. 2. minimum dc input voltage on a9 pin is ?.5 v. during voltage transitions, a9 and v pp may overshoot v ss to ?.0 v for periods of up to 20 ns. a9 and v cc must not exceed +13.5 v at any time. stresses above those listed under ?bsolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the opera- tional sections of this speci?ation is not implied. exposure of the device to absolute maximum rating conditions for ex- tended periods may affect device reliability. operating ranges commercial (c) devices ambient temperature (t a ). . . . . . . . . . . .0 c to +70 c industrial (i) devices ambient temperature (t a ). . . . . . . . . .?0 c to +85 c extended (e) devices ambient temperature (t a ). . . . . . . . .?5 c to +125 c supply read voltages v cc for am27c010-45, 255 . . . . . +4.75 v to +5.25 v v cc for am27c010-45, 55, 70, 90, 120, 150, 200 . . . . . . . . . . . . . +4.50 v to +5.50 v operating ranges de?e those limits between which the functionality of the device is guaranteed.
am27c010 9 dc characteristics over operating ranges unless otherwise speci?d (notes 1, 2, axnd 4) notes: 1. v cc must be applied simultaneously or before v pp , and removed simultaneously or after v pp . 2. caution : the am27c010 must not be removed from (or inserted into) a socket when v cc or v pp is applied. 3. i cc1 is tested with oe = v ih to simulate open outputs. 4. minimum dc input voltage is ?.5 v. during transitions, the inputs may overshoot to ?.0 v for periods less than 20 ns. maximum dc voltage on output pins is v cc + 0.5 v, which may overshoot to v cc + 2.0 v for periods less than 20 ns. figure 1. typical supply current vs. frequency v cc = 5.5 v, t = 25 c figure 2. typical supply current vs. temperature v cc = 5.5 v, f = mhz parameter symbol parameter description test conditions min max unit v oh output high voltage i oh = ?00 m a 2.4 v v ol output low voltage i ol = 2.1 ma 0.45 v v ih input high voltage 2.0 v cc + 0.5 v v il input low voltage ?.5 +0.8 v i li input load current v in = 0 v to v cc 1.0 m a i lo output leakage current v out = 0 v to v cc 5.0 m a i cc1 v cc active current (note 3) ce = v il , f = 10 mhz, i out = 0 ma c/i devices 30 ma e devices 60 i cc2 v cc ttl standby current ce = v ih 1.0 ma i cc3 v cc cmos standby current ce = v cc 0.3 v 100 m a i pp1 v pp current during reading ce = oe = v il , v pp = v cc 100 m a frequency in mhz 10205f-6 12345678910 30 25 20 15 10 supply current in ma 10205f-7 ?5 ?0 ?5 0 25 50 75 100 125 150 30 25 20 15 10 temperature in c supply current in ma
10 am27c010 capacitance notes: 1. this parameter is only sampled and not 100% tested. 2. t a = +25 c, f = 1 mhz. ac characteristics notes: 1. caution: do not remove the am27c010 from (or insert it into) a socket or board that has v pp or v cc applied. 2. v cc must be applied simultaneously or before v pp , and removed simultaneously or after v pp . 3. this parameter is sampled and not 100% tested. 4. switching characteristics are over operating range, unless otherwise speci?d. 5. test conditions for am27c010-45 and -55: output load: 1 ttl gate and c l = 30 pf input rise and fall times: 20 ns input pulse levels: 0.0 v to 3.0 v timing measurement reference level inputs and outputs: 1.5 v test conditions for all others: output load: 1 ttl gate and c l = 100 pf input rise and fall times: 20 ns input pulse levels: 0.45 v to 2.4 v timing measurement reference level inputs and outputs: 0.8 and 2.0 v parameter symbol parameter description test conditions cdv032 pl 032 pd 032 ts 032 unit typ max typ max typ max typ max c in input capacitance v in = 0 9128128121012pf c out output capacitance v out = 0 1315111411141214pf parameter symbols parameter description test conditions am27c010 unit jedec standard -45 -55 -70 -90 -120 -150 -200 -255 t avqv t acc address to output delay ce , oe = v il max 45 55 70 90 120 150 200 250 ns t elqv t ce chip enable to output delay oe = v il max 45 55 70 90 120 150 200 250 ns t glqv t oe output enable to output delay ce = v il max 25 35 35 40 50 65 75 75 ns t ehqz t ghqz t df (note 3) chip enable high or output enable high to output float, whichever occurs first max 25 25 25 25 35 35 40 40 ns t axqx t oh output hold from addresses, ce, or oe , whichever occurs first min00000000ns
am27c010 11 switching test circuit figure 1. test conditions switching test waveform 2.7 k w diodes = in3064 or equivalent c l 6.2 k w 5.0 v in3064 or equivalent notes: for -45 and -55: c l = 30 pf including jig capacitance for all others: c l = 100 pf including jig capacitance device under test 10205f-8 2.4 v 0.45 v input output test points 2.0 v 2.0 v 0.8 v 0.8 v 10205f-9 3 v 0 v input output 1.5 v 1.5 v test points ac testing (except for -45 and -55 devices): inputs are driven at 2.4 v for a logic ? and 0.45 v for a logic ?? input pulse rise and fall times are 20 ns. ac testing for -45 and -55 devices: inputs are driven at 3.0 v for a logic ? and 0 v for a logic ?? input pulse rise and fall times are 20 ns.
12 am27c010 revision summary for am27c010 distinctive characteristics: the fastest speed grade available is now 45 ns. product selector guide: added 45 ns column. the v cc operating range for the 55 ns speed grade changed from 5% to 10%. the part number designa- tion remains the same (-55). ordering information, uv eprom products: the 45 ns part number is now listed in the example. the nomenclature now has a method of clearly desig- nating the voltage operating range and speed grade. valid combinations: the 45 ns and 55 ns speed grades are now also available in the industrial temperature range and can be burned in. ordering information, otp eprom products: changed the part number example from -55 to -45. the nomenclature now has a method of clearly designating the voltage operating range and speed grade. valid combinations: added the 45 ns and 55 ns speed grades to the table. operating ranges: changed supply read voltages listings to match those in the product selector guide. ac characteristics: added column for 45 ns speed grade, rearranged notes, moved text from table title to note 4, renamed table. switching test circuit: added 45 ns to the c l note on 30 pf test condition. switching test waveform: added the 3 v test waveform. introduction: this amendment will be available through the web in ad- dition to, not instead of, the literature ordering hotline. switching test waveform: the caption now reads ?.. inputs are driven at ... 0 v for a logic ??..? trademarks copyright ?1997 advanced micro devices, inc. all rights reserved. amd, the amd logo, and combinations thereof are trademarks of advanced micro devices, inc. flashrite is a trademark of advanced micro devices, inc. product names used in this publication are for identi?ation purposes only and may be trademarks of their respective companies.


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