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  sn54als00a, sn54as00, sn74als00a, sn74as00 quadruple 2-input positive-nand gates sdas187a april 1982 revised december 1994 copyright ? 1994, texas instruments incorporated 1 post office box 655303 ? dallas, texas 75265 ? package options include plastic small-outline (d) packages, ceramic chip carriers (fk), and standard plastic (n) and ceramic (j) 300-mil dips description these devices contain four independent 2-input positive-nand gates. they perform the boolean functions y = a ? b or y = a + b in positive logic. the sn54als00a and sn54as00 are characterized for operation over the full military temperature range of 55 c to 125 c. the sn74als00a and sn74as00 are characterized for operation from 0 c to 70 c. function table (each gate) inputs output a b y h h l l xh x l h logic symbol 2 1 1a 2 1b 4 2a 5 2b 9 3a 10 3b 12 4a 13 4b & 1y 3 2y 6 3y 8 4y 11 2 this symbol is in accordance with ansi/ieee std 91-1984 and iec publication 617-12. pin numbers shown are for the d, j, and n packages. sn54als00a, sn54as00 ...j p ackage sn74als00a, sn74as00 ...d or n p ackage (top view) 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1a 1b 1y 2a 2b 2y gnd v cc 4b 4a 4y 3b 3a 3y sn54als00a, sn54as00 . . . fk package (top view) 3 2 1 20 19 9 10 11 12 13 4 5 6 7 8 18 17 16 15 14 4a nc 4y nc 3b 1y nc 2a nc 2b 1b 1a nc 3y 3a v 4b 2y nc cc nc no internal connection gnd production data information is current as of publication date. products conform to specifications per the terms of texas instruments standard warranty. production processing does not necessarily include testing of all parameters.
sn54als00a, sn54as00, sn74als00a, sn74as00 quadruple 2-input positive-nand gates sdas187a april 1982 revised december 1994 2 post office box 655303 ? dallas, texas 75265 logic diagram (positive logic) 1y 3 1 1a 2 1b 2y 6 4 2a 5 2b 3y 8 9 3a 10 3b 4y 11 12 4a 13 4b pin numbers shown are for the d, j, and n packages. absolute maximum ratings over operating free-air temperature range (unless otherwise noted) 2 supply voltage, v cc 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . input voltage, v i 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . operating free-air temperature range, t a : sn54als00a 55 c to 125 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . sn74als00a 0 c to 70 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . storage temperature range 65 c to 150 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 stresses beyond those listed under aabsolute maximum ratingso may cause permanent damage to the device. these are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions sn54als00a sn74als00a unit min nom max min nom max unit v cc supply voltage 4.5 5 5.5 4.5 5 5.5 v v ih high-level input voltage 2 2 v v il low-level input voltage 0.8 3 0.8 v v il l ow- l eve l i npu t vo lt age 0.7 v i oh high-level output current 0.4 0.4 ma i ol low-level output current 4 8 ma t a operating free-air temperature 55 125 0 70 c 3 applies over temperature range 55 c to 70 c applies over temperature range 70 c to 125 c
sn54als00a, sn54as00, sn74als00a, sn74as00 quadruple 2-input positive-nand gates sdas187a april 1982 revised december 1994 3 post office box 655303 ? dallas, texas 75265 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) parameter test conditions sn54als00a sn74als00a unit parameter test conditions min typ 2 max min typ 2 max unit v ik v cc = 4.5 v, i i = 18 ma 1.2 1.5 v v oh v cc = 4.5 v to 5.5 v, i oh = 0.4 ma v cc 2 v cc 2 v v ol v cc =45v i ol = 4 ma 0.25 0.4 0.25 0.4 v v ol v cc = 4 . 5 v i ol = 8 ma 0.35 0.5 v i i v cc = 5.5 v, v i = 7 v 0.1 0.1 ma i ih v cc = 5.5 v, v i = 2.7 v 20 20 m a i il v cc = 5.5 v, v i = 0.4 v 0.1 0.1 ma i o 3 v cc = 5.5 v, v o = 2.25 v 20 112 30 112 ma i cch v cc = 5.5 v, v i = 0 0.5 0.85 0.5 0.85 ma i ccl v cc = 5.5 v, v i = 4.5 v 1.5 3 1.5 3 ma 2 all typical values are at v cc = 5 v, t a = 25 c. 3 the output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, i os . switching characteristics (see figure 1) parameter from ( input ) to ( output ) v cc = 4.5 v to 5.5 v, c l = 50 pf, r l = 500 w , t a = min to max unit (input) (output) sn54als00a sn74als00a min max min max t plh aorb y 3 15 3 11 ns t phl a or b y 2 9 2 8 ns for conditions shown as min or max, use the appropriate value specified under recommended operating conditions.
sn54als00a, sn54as00, sn74als00a, sn74as00 quadruple 2-input positive-nand gates sdas187a april 1982 revised december 1994 4 post office box 655303 ? dallas, texas 75265 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) 2 supply voltage, v cc 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . input voltage, v i 7 v . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . operating free-air temperature range, t a : sn54as00 55 c to 125 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . sn74as00 0 c to 70 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . storage temperature range 65 c to 150 c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 stresses beyond those listed under aabsolute maximum ratingso may cause permanent damage to the device. these are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under arecommended operating conditionso is not implied. exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions sn54as00 sn74as00 unit min nom max min nom max unit v cc supply voltage 4.5 5 5.5 4.5 5 5.5 v v ih high-level input voltage 2 2 v v il low-level input voltage 0.8 0.8 v i oh high-level output current 2 2 ma i ol low-level output current 20 20 ma t a operating free-air temperature 55 125 0 70 c electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) parameter test conditions sn54as00 sn74as00 unit parameter test conditions min typ 3 max min typ 3 max unit v ik v cc = 4.5 v, i i = 18 ma 1.2 1.2 v v oh v cc = 4.5 v to 5.5 v, i oh = 2 ma v cc 2 v cc 2 v v ol v cc = 4.5 v, i ol = 20 ma 0.35 0.5 0.35 0.5 v i i v cc = 5.5 v, v i = 7 v 0.1 0.1 ma i ih v cc = 5.5 v, v i = 2.7 v 20 20 m a i il v cc = 5.5 v, v i = 0.4 v 0.5 0.5 ma i o v cc = 5.5 v, v o = 2.25 v 30 112 30 112 ma i cch v cc = 5.5 v, v i = 0 2 3.2 2 3.2 ma i ccl v cc = 5.5 v, v i = 4.5 v 10.8 17.4 10.8 17.4 ma 3 all typical values are at v cc = 5 v, t a = 25 c. the output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, i os . switching characteristics (see figure 1) parameter from ( input ) to ( output ) v cc = 4.5 v to 5.5 v, c l = 50 pf, r l = 500 w , t a = min to max ? unit (input) (output) sn54as00 sn74as00 min max min max t plh aorb y 1 5 1 4.5 ns t phl a or b y 1 5 1 4 ns ? for conditions shown as min or max, use the appropriate value specified under recommended operating conditions.
sn54als00a, sn54as00, sn74als00a, sn74as00 quadruple 2-input positive-nand gates sdas187a april 1982 revised december 1994 5 post office box 655303 ? dallas, texas 75265 parameter measurement information series 54als/74als and 54as/74as devices t phz t plz t phl t plh 0.3 v t pzl t pzh t plh t phl load circuit for 3-state outputs from output under test test point r1 s1 c l (see note a) 7 v 1.3 v 1.3 v 1.3 v 3.5 v 3.5 v 0.3 v 0.3 v t h t su voltage waveforms setup and hold times timing input data input 1.3 v 1.3 v 3.5 v 3.5 v 0.3 v 0.3 v high-level pulse low-level pulse t w voltage waveforms pulse durations input out-of-phase output (see note c) 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 1.3 v 3.5 v 3.5 v 0.3 v 0.3 v v ol v oh v oh v ol output control (low-level enabling) waveform 1 s1 closed (see note b) waveform 2 s1 open (see note b)  0 v v oh v ol  3.5 v in-phase output 0.3 v 1.3 v 1.3 v voltage waveforms propagation delay times voltage waveforms enable and disable times, 3-state outputs r2 v cc r l test point from output under test c l (see note a) load circuit for open-collector outputs load circuit for bi-state totem-pole outputs from output under test test point c l (see note a) r l r l = r1 = r2 notes: a. c l includes probe and jig capacitance. b. waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. c. when measuring propagation delay items of 3-state outputs, switch s1 is open. d. all input pulses have the following characteristics: prr 1 mhz, t r = t f = 2 ns, duty cycle = 50%. e. the outputs are measured one at a time with one transition per measurement. figure 1. load circuits and voltage waveforms
important notice texas instruments (ti) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current. ti warrants performance of its semiconductor products and related software to the specifications applicable at the time of sale in accordance with ti's standard warranty. testing and other quality control techniques are utilized to the extent ti deems necessary to support this warranty. specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. certain applications using semiconductor products may involve potential risks of death, personal injury, or severe property or environmental damage (acritical applicationso). ti semiconductor products are not designed, intended, authorized, or warranted to be suitable for use in life-support applications, devices or systems or other critical applications. inclusion of ti products in such applications is understood to be fully at the risk of the customer. use of ti products in such applications requires the written approval of an appropriate ti officer. questions concerning potential risk applications should be directed to ti through a local sc sales office. in order to minimize risks associated with the customer's applications, adequate design and operating safeguards should be provided by the customer to minimize inherent or procedural hazards. ti assumes no liability for applications assistance, customer product design, software performance, or infringement of patents or services described herein. nor does ti warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of ti covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. copyright ? 1996, texas instruments incorporated


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